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27 September 2016 Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems
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Abstract
In this work we present a method used to study the spherical and chromatic aberrations contribution near the focal point of a refractive optical system. The actual focal position is measured by scanning a pinhole attached on the front of a power detector, which are scanned along the optical axis using a motorized stage with 1 μm resolution. Spherical aberration contribution was analyzed by changing the pupil aperture, by modifying the size of the input iris diaphragm and for each case, measuring the actual laser power vs the detector position. Chromatic aberration was analyzed by performing the same procedure but in this case we used an ultra-broad-band femtosecond laser. The results between ML and CW operation were compare. Experimental results are presented.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pablo Castro-Marín, Jesús Garduño-Mejía, Martha Rosete-Aguilar, Neil C. Bruce, Derryck T. Reid, C. Farrell, and Gabriel E. Sandoval-Romero "Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems", Proc. SPIE 9953, Optical Modeling and Performance Predictions VIII, 99530Q (27 September 2016); https://doi.org/10.1117/12.2238239
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