Enhanced sensitivity for optical loss measurement in planar thin-films
(Conference Presentation)

Hua-Kang Yuan

doi:10.1117/12.2237132

2 November 2016 Enhanced sensitivity for optical loss measurement in planar thin-films (Conference Presentation)

Hua-Kang Yuan

Proceedings Volume 9961, Reflection, Scattering, and Diffraction from Surfaces V; 99610J (2016) https://doi.org/10.1117/12.2237132
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

An organic-inorganic hybrid material benefits from processing advantages of organics and high refractive indices of inorganics. We focus on a titanium oxide hydrate system combined with common bulk polymers. In particular, we target thin-film structures of a few microns in thickness. Traditional Beer-Lambert approaches for measuring optical losses can only provide an upper limit estimate. This sensitivity is highly limited when considering the low-losses required for mid-range optical applications, on the order of 0.1 cm-1. For intensity based measurements, improving the sensitivity requires an increase in the optical path length. Instead, a new sensitive technique suitable for simple planar thin films is required. A number of systems were modelled to measure optical losses in films of 1 micron thick. The presented techniques utilise evanescent waves and total internal reflection to increase optical path length through the material. It was found that a new way of using prism coupling provides the greatest improvement in sensitivity. In keeping the requirements on the material simple, this method for measuring loss is well suited to any future developments of new materials in thin-film structures.

Conference Presentation

Citation Download Citation

Hua-Kang Yuan "Enhanced sensitivity for optical loss measurement in planar thin-films (Conference Presentation)", Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 99610J (2 November 2016); https://doi.org/10.1117/12.2237132

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
PRESENTATION

WATCH
PRESENTATION SAVE TO MY LIBRARY

GET CITATION

KEYWORDS

Thin films

Optical testing

Systems modeling

Organic hybrid materials

Oxides

Polymers

Prisms

Show All Keywords

Keywords/Phrases

Search In:

Publication Years