Presentation + Paper
16 September 2016 Simulation tools for analyzer-based x-ray phase contrast imaging system with a conventional x-ray source
Oriol Caudevilla, Wei Zhou, Stanislav Stoupin, Boris Verman, J. G. Brankov
Author Affiliations +
Abstract
Analyzer-based X-ray phase contrast imaging (ABI) belongs to a broader family of phase-contrast (PC) X-ray imaging modalities. Unlike the conventional X-ray radiography, which measures only X-ray absorption, in PC imaging one can also measures the X-rays deflection induced by the object refractive properties. It has been shown that refraction imaging provides better contrast when imaging the soft tissue, which is of great interest in medical imaging applications. In this paper, we introduce a simulation tool specifically designed to simulate the analyzer-based X-ray phase contrast imaging system with a conventional polychromatic X-ray source. By utilizing ray tracing and basic physical principles of diffraction theory our simulation tool can predicting the X-ray beam profile shape, the energy content, the total throughput (photon count) at the detector. In addition we can evaluate imaging system point-spread function for various system configurations.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oriol Caudevilla, Wei Zhou, Stanislav Stoupin, Boris Verman, and J. G. Brankov "Simulation tools for analyzer-based x-ray phase contrast imaging system with a conventional x-ray source", Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640E (16 September 2016); https://doi.org/10.1117/12.2241205
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KEYWORDS
Crystals

X-rays

X-ray imaging

Imaging systems

X-ray sources

Phase contrast

Sensors

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