Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

A. Hipp; J. Herzen; J. U. Hammel; P. Lytaev; A. Schreyer; F. Beckmann

doi:10.1117/12.2237582

3 October 2016 Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

A. Hipp, J. Herzen, J. U. Hammel, P. Lytaev, A. Schreyer, F. Beckmann

Author Affiliations +

Proceedings Volume 9967, Developments in X-Ray Tomography X; 996718 (2016) https://doi.org/10.1117/12.2237582
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States

Abstract

Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase- contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

Citation Download Citation

A. Hipp, J. Herzen, J. U. Hammel, P. Lytaev, A. Schreyer, and F. Beckmann "Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources", Proc. SPIE 9967, Developments in X-Ray Tomography X, 996718 (3 October 2016); https://doi.org/10.1117/12.2237582

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