Developer molecular size dependence of pattern formation of polymer type electron beam resists with various molecular weights

Tomohiro Takayama; Hironori Asada; Yukiko Kishimura; Shunsuke Ochiai; Ryoichi Hoshino; Atsushi Kawata

doi:10.1117/12.2240296

10 May 2016 Developer molecular size dependence of pattern formation of polymer type electron beam resists with various molecular weights

Tomohiro Takayama, Hironori Asada, Yukiko Kishimura, Shunsuke Ochiai, Ryoichi Hoshino, Atsushi Kawata

Author Affiliations +

Proceedings Volume 9984, Photomask Japan 2016: XXIII Symposium on Photomask and Next-Generation Lithography Mask Technology; 99840L (2016) https://doi.org/10.1117/12.2240296
Event: Photomask Japan 2016, 2016, Yokohama, Japan

Abstract

The sensitivity and the resolution are affected by not only the nature of the resist such as a chemical structure and a molecular weight but also the developing process such as a developer molecular size. Exposure characteristics of positive-tone polymer resists having various molecular weights (Mw’s) ranging from 60 k to 500 k are investigated using different ester solvents as a developer. The line-and-space (L/S) patterns are exposed by the electron beam writing system with an acceleration voltage of 50 kV and the samples are developed by amyl acetate, hexyl acetate and heptyl acetate. The pattern shape becomes better and the surface of the resist also becomes smoother with increasing developer molecular size, though the exposure dose required for the formation of the L/S pattern increases. The dose margin of pattern formation is also wider in all the resists having the different molecular weights. The dissolution in the unexposed portions of the 60k-Mw resist for heptyl acetate is reduced significantly compared with those for amyl acetate and hexyl acetate. The improvement of the pattern shape and the increasing of dose margin are remarkable in the low molecular weight resist. The 3σ of line width roughness tends to be smaller in the higher molecular weight resist and with the larger molecular size developer. Exposure experiment of the 35 nm pitch pattern using the 500k-Mw resist developed at the room temperature is presented.

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Tomohiro Takayama, Hironori Asada, Yukiko Kishimura, Shunsuke Ochiai, Ryoichi Hoshino, and Atsushi Kawata "Developer molecular size dependence of pattern formation of polymer type electron beam resists with various molecular weights", Proc. SPIE 9984, Photomask Japan 2016: XXIII Symposium on Photomask and Next-Generation Lithography Mask Technology, 99840L (10 May 2016); https://doi.org/10.1117/12.2240296

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KEYWORDS

Electron beams

Line width roughness

Polymers

Scanning electron microscopy

Photoresist processing

Line edge roughness

Photomasks

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