Super-resolved identification of nanoscale defects in low-dimensional materials by near-field photoluminescence mapping

Huang Jiatai; Cui Tong; Bai Benfeng

doi:10.1117/12.2642169

3 January 2023 Super-resolved identification of nanoscale defects in low-dimensional materials by near-field photoluminescence mapping

Huang Jiatai, Cui Tong, Bai Benfeng

Author Affiliations +

Proceedings Volume PC12316, Advanced Optical Imaging Technologies V; PC123160B (2023) https://doi.org/10.1117/12.2642169
Event: SPIE/COS Photonics Asia, 2022, Online Only

Abstract

This conference presentation was prepared for Advanced Optical Imaging Technologies V conference at Photonics Asia, 2022.

Conference Presentation

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Huang Jiatai, Cui Tong, and Bai Benfeng "Super-resolved identification of nanoscale defects in low-dimensional materials by near-field photoluminescence mapping", Proc. SPIE PC12316, Advanced Optical Imaging Technologies V, PC123160B (3 January 2023); https://doi.org/10.1117/12.2642169

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