High-fidelity trapped-ion state detection with an integrated avalanche photodiode

Robert McConnell; David Reens; Michael Collins; Joseph Ciampi; Dave Kharas; Brian Aull; Kevan Donlon; Colin D. Bruzewicz; Bradley Felton; Jules Stuart; Robert Niffenegger; Philip Rich; Danielle Braje; Kevin Ryu; John Chiaverini

doi:10.1117/12.2657368

9 March 2023 High-fidelity trapped-ion state detection with an integrated avalanche photodiode

Robert McConnell, David Reens, Michael Collins, Joseph Ciampi, Dave Kharas, Brian Aull, Kevan Donlon, Colin D. Bruzewicz, Bradley Felton, Jules Stuart, Robert Niffenegger, Philip Rich, Danielle Braje, Kevin Ryu, John Chiaverini

Author Affiliations +

Proceedings Volume PC12447, Quantum Sensing, Imaging, and Precision Metrology; PC1244727 (2023) https://doi.org/10.1117/12.2657368
Event: SPIE Quantum West, 2023, San Francisco, California, United States

Abstract

Integrated technologies represent a key enabling capability for future compact and portable atomic physics systems, including optical clocks and other sensors. In this talk, I will discuss our recent demonstration of high-fidelity detection of the state of a trapped Sr+ ion with a single-photon avalanche detector (SPAD) integrated into a microfabricated surface-electrode trap. Using an adaptive technique, we achieve ion state detection in 450 us with 99.92(1)% average fidelity. I will also discuss ongoing efforts to combine integrated detectors with integrated photonics to enable ion traps that completely eliminate the need for free-space optics for light delivery and collection.

Conference Presentation

Citation Download Citation

Robert McConnell, David Reens, Michael Collins, Joseph Ciampi, Dave Kharas, Brian Aull, Kevan Donlon, Colin D. Bruzewicz, Bradley Felton, Jules Stuart, Robert Niffenegger, Philip Rich, Danielle Braje, Kevin Ryu, and John Chiaverini "High-fidelity trapped-ion state detection with an integrated avalanche photodiode", Proc. SPIE PC12447, Quantum Sensing, Imaging, and Precision Metrology, PC1244727 (9 March 2023); https://doi.org/10.1117/12.2657368

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