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9 June 2023 Time-resolved resonant X-ray scattering at PAL-XFEL (Conference Presentation)
Saehwan Chun
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Proceedings Volume PC12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; PC125810B (2023) https://doi.org/10.1117/12.2669159
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic
Abstract
The recent development of X-ray free electron lasers (XFELs) has made a breakthrough extending resonant X-ray scattering techniques into the ultrafast time domain via ultrashort femtosecond X-ray pulses with high brightness. In this talk, I will discuss the time-resolved resonant X-ray scattering instruments available for the user’s beamtime experiment at PAL-XFEL. They utilize the self-seeded hard X-ray beam, of which monochromatic characteristics are brighter flux and narrower bandwidth than those of the monochromatic beam filtered from the SASE beam. The advanced experimental platform established at PAL-XFEL may contribute to the emerging research paradigm to understand ultrafast non-equilibrium dynamics of material states.
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Saehwan Chun "Time-resolved resonant X-ray scattering at PAL-XFEL (Conference Presentation)", Proc. SPIE PC12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810B (9 June 2023); https://doi.org/10.1117/12.2669159
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KEYWORDS
X-rays
Laser scattering
Scattering
Ultrafast phenomena
Materials properties
Materials science
Resonance enhancement
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