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5 October 2023 Mid-infrared near-field fingerprint spectroscopy of the 2D electron gas in LaAlO3/SrTiO3 at low temperatures
Julian Barnett, Konstantin G. Wirth, Richard Hentrich, Yasin C. Durmaz, Felix Gunkel, Marc-Andre Rose, Thomas Taubner
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Proceedings Volume PC12651, Low-Dimensional Materials and Devices 2023; PC1265107 (2023) https://doi.org/10.1117/12.2683718
Event: SPIE Nanoscience + Engineering, 2023, San Diego, California, United States
Abstract
Scattering-type scanning near-field optical microscopy (s-SNOM) is a useful tool for the non-destructive investigation of buried confined electron systems with nanoscale resolution, however, a clear separation of carrier concentration and mobility was often not possible. Here, we predict a characteristic (“fingerprint”) response of the LaAlO3/SrTiO3 2DEG in the mid-infrared spectral range, which was not experimentally accessible in the past, and verify this using a state-of-the-art tunable narrow-band laser in cryo-s-SNOM at 8 K. Our modelling allows us to separate the influence of carrier concentration and mobility on fingerprint near-field spectra, which we use to characterize 2DEG inhomogeneities on the nanoscale.
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Julian Barnett, Konstantin G. Wirth, Richard Hentrich, Yasin C. Durmaz, Felix Gunkel, Marc-Andre Rose, and Thomas Taubner "Mid-infrared near-field fingerprint spectroscopy of the 2D electron gas in LaAlO3/SrTiO3 at low temperatures", Proc. SPIE PC12651, Low-Dimensional Materials and Devices 2023, PC1265107 (5 October 2023); https://doi.org/10.1117/12.2683718
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KEYWORDS
Mid-IR
Near field
Quantum confinement
Spectroscopy
Electrical properties
Inhomogeneities
Near field scanning optical microscopy
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