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The improvements of the accuracy of mixture synthesis in X-ray imaging using noise correction per pixel was aimed in this study. Direct conversion type detectors with semiconductors were used, and image correction was performed for each pixel. The entire image was synthesized in each energy band, and the results were compared to the image as energy integrated type. The imaging corrected using shot noise showed better contrast for both low and high atomic number areas, synthesizing multiple mixtures in a single image data without compromising contrast. This result could lead to higher accuracy in X-ray imaging for detecting mixed materials.
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