Multibeam x-ray ptychography: Using partial coherence to speed-up high-resolution imaging

Mikhail Lyubomirskiy; Tang Li; Maik Kahnt; Felix Wittwer; Martin Seyrich; Adam Kubec; Ken Falch; Jan Garrevoet; Christian David; Christian Schroer

doi:10.1117/12.2675485

6 October 2023 Multibeam x-ray ptychography: Using partial coherence to speed-up high-resolution imaging

Mikhail Lyubomirskiy, Tang Li, Maik Kahnt, Felix Wittwer, Martin Seyrich, Adam Kubec, Ken Falch, Jan Garrevoet, Christian David, Christian Schroer

Author Affiliations +

Proceedings Volume PC12698, X-Ray Nanoimaging: Instruments and Methods VI; PC1269805 (2023) https://doi.org/10.1117/12.2675485
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

This conference presentation was prepared for SPIE Optical Engineering + Applications, 2023.

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Mikhail Lyubomirskiy, Tang Li, Maik Kahnt, Felix Wittwer, Martin Seyrich, Adam Kubec, Ken Falch, Jan Garrevoet, Christian David, and Christian Schroer "Multibeam x-ray ptychography: Using partial coherence to speed-up high-resolution imaging", Proc. SPIE PC12698, X-Ray Nanoimaging: Instruments and Methods VI, PC1269805 (6 October 2023); https://doi.org/10.1117/12.2675485

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