Presentation
4 October 2024 Inelastic x-ray scattering (IXS) spectrometer design studies at LCLS
Author Affiliations +
Abstract
While there are many variations of an Inelastic X-ray Scattering (IXS) spectrometer, the figure of merit is often the energy resolution and the throughput. As part of the LCLS-II-HE project, the DXS team is developing a hard X-ray IXS spectrometer with a resolution of 5 meV at 11.215 keV. The spectrometer relies on a so-called post-sample-collimation scheme, and this high degree of resolution comes with stringent precision and stability requirements. SHADOWOui is used to simulate the setup and analyze the tolerance of 4 optics’ axis (translation, pitch, yaw, roll) and the miscut angle of the channel-cut crystal of the design. The simulation indicates that a 5 meV resolution is achievable by ensuring stringent pitch and vertical translation tolerances. Furthermore, the simulation suggests that a miscut angle of 77 degrees, which necessitates high-quality crystal manufacturing, is optimal.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshio Ichii, Frank P. O'Dowd, Quentin Yougoubare, Matthew H. Seaberg, Randy A. Whitney, May Ling Ng, Lin Zhang, Robert A. Baker, Luca Rebuffi, and Hasan Yavas "Inelastic x-ray scattering (IXS) spectrometer design studies at LCLS", Proc. SPIE PC13150, Advances in X-Ray/EUV Optics and Components XIX, PC1315007 (4 October 2024); https://doi.org/10.1117/12.3026062
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KEYWORDS
Crystals

Scattering

Spectroscopy

Liquid crystal lasers

Parabolic mirrors

Spectrometer engineering

Collimation

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