While there are many variations of an Inelastic X-ray Scattering (IXS) spectrometer, the figure of merit is often the energy resolution and the throughput. As part of the LCLS-II-HE project, the DXS team is developing a hard X-ray IXS spectrometer with a resolution of 5 meV at 11.215 keV. The spectrometer relies on a so-called post-sample-collimation scheme, and this high degree of resolution comes with stringent precision and stability requirements. SHADOWOui is used to simulate the setup and analyze the tolerance of 4 optics’ axis (translation, pitch, yaw, roll) and the miscut angle of the channel-cut crystal of the design. The simulation indicates that a 5 meV resolution is achievable by ensuring stringent pitch and vertical translation tolerances. Furthermore, the simulation suggests that a miscut angle of 77 degrees, which necessitates high-quality crystal manufacturing, is optimal.
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