Presentation
13 November 2024 Advancing EUV lithography optics supporting current roadmap and beyond
Olaf Conradi, Paul Gräupner, Peter Kuerz, Wolfgang Seitz, Jan van Schoot, Roel Moors
Author Affiliations +
Abstract
The optical train is a key element of each lithography scanner. The single patterning resolution limit of a scanner is determined by the characteristics and performance of its imaging system consisting of illumination and projection optics. In this paper, we present status and performance parameters of the next generation “High-NA EUV” optical system. Further, we discuss the current NA 0.33 optical system, where key parameters have been improved to support higher productivity in volume production. Additionally, the EUV roadmap and further progress of our developments will be shown.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olaf Conradi, Paul Gräupner, Peter Kuerz, Wolfgang Seitz, Jan van Schoot, and Roel Moors "Advancing EUV lithography optics supporting current roadmap and beyond", Proc. SPIE PC13215, International Conference on Extreme Ultraviolet Lithography 2024, PC1321503 (13 November 2024); https://doi.org/10.1117/12.3034698
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KEYWORDS
EUV optics

Extreme ultraviolet lithography

Imaging systems

Extreme ultraviolet

Light sources and illumination

Projection systems

Scanners

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