Fringe patterns can be formed coherently using various interferometers and
incoherently using the moiré technique. They can also be designed in fringe
projection profilometry. All of these techniques are useful for full-field,
noncontact, and high-sensitivity measurement. The primary goal of fringe
pattern analysis is to extract the hidden phase distributions that generally
relate to the physical quantities being measured. This book addresses the
challenges and solutions involved in this process. Both theoretical analysis and
algorithm development are covered to facilitate the work of both researchers
and engineers. The information herein may also serve as a specialized subject
for students of optical and computer engineering. Readers are encouraged to
provide the author with feedback for improvement.
I would like to thank all of my collaborators, Prof. Anand Asundi, Dr. Yu
Fu, Dr. Wenjing Gao, Dr. Lei Huang, Ms. Nguyen Thi Thanh Huyen, Prof.
Li Kai, Prof. Feng Lin, Dr. Qi Liu, Dr. Ho Sy Loi, Prof. Hong Miao, Mr. Le
Tran Hoai Nam, Prof. Bing Pan, Prof. Hock Soon Seah, Dr. Fangjun Shu,
Prof. Xianyu Su, Dr. Haixia Wang, Prof. Xiaoping Wu, Prof. Huimin Xie,
Prof. Boqin Xu, Prof. Qican Zhang, and Mr. Ming Zhao. Because of you,
I have been enjoying the beauty of fringe patterns. Special thanks go to
Dr. Lei Huang, Dr. Haixia Wang, and Dr. Wenjing Gao for proofreading
my manuscript, and to the peer reviewers who provided encouragement and
constructive comments. Thanks also go to Mr. Timothy Lamkins for quickly
turning a proposal into a project, to editor Kerry Eastwood for her
professional and terrific hard work on the manuscript, to the SPIE staff
who have helped facilitate the production of this book, and to SPIE Press for
publishing the book. Finally, I owe much thanks to my parents, my parents-in-
law, my wife Xiaocong, and my son Zihan for their love and support.
Qian Kemao
Nanyang Technological University
July 2013