Radiation tolerance of a Geiger-mode avalanche photodiode imaging array

Kimberly E. Kolb; Donald F. Figer; Joong Y. Lee; Brandon J. Hanold

doi:10.1117/1.JATIS.2.3.036001

6 July 2016 Radiation tolerance of a Geiger-mode avalanche photodiode imaging array

Kimberly E. Kolb, Donald F. Figer, Joong Y. Lee, Brandon J. Hanold

Journal of Astronomical Telescopes, Instruments, and Systems, Vol. 2, Issue 3, 036001 (July 2016). https://doi.org/10.1117/1.JATIS.2.3.036001

Abstract

Radiation testing results for a Geiger-mode avalanche photodiode (GM-APD) array-based imager are reviewed. Radiation testing is a crucial step in technology development that assesses the readiness of a specific device or instrument for space-based missions or other missions in high-radiation environments. Pre- and postradiation values for breakdown voltage, dark count rate (DCR), after pulsing probability, photon detection efficiency (PDE), crosstalk probability, and intrapixel sensitivity are presented. Details of the radiation testing setup and experiment are provided. The devices were exposed to a total dose of 50 krad(Si) at the Massachusetts General Hospital’s Francis H. Burr Proton Therapy Center, using monoenergetic 60 MeV protons as the radiation source. This radiation dose is equivalent to radiation absorbed over 10 solar cycles at an L2 orbit with 1-cm aluminum shielding. The DCR increased by 2.3 e−/s/pix/krad(Si) at 160 K, the afterpulsing probability increased at all temperatures and settings by a factor of ∼2, and the effective breakdown voltage shifted by +1.5 V. PDE, crosstalk probability, and intrapixel sensitivity were unchanged by radiation damage. The performance of the GM-APD imaging array is compared to the performance of the CCD on board the ASCA satellite with a similar radiation shield and radiation environment.

Citation Download Citation

Kimberly E. Kolb, Donald F. Figer, Joong Y. Lee, and Brandon J. Hanold "Radiation tolerance of a Geiger-mode avalanche photodiode imaging array," Journal of Astronomical Telescopes, Instruments, and Systems 2(3), 036001 (6 July 2016). https://doi.org/10.1117/1.JATIS.2.3.036001

Published: 6 July 2016

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $24.00

Non-members: $28.00 ADD TO CART

JOURNAL ARTICLE
12 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Sensors

Imaging arrays

Charge-coupled devices

Tolerancing

Avalanche photodiodes

Signal to noise ratio

Electron multiplying charge coupled devices

Show All Keywords

Keywords/Phrases

Search In:

Publication Years