6 August 2019 Optical phase retrieval using four rotated versions of a single binary amplitude modulating mask
Varis Karitans, Edgars Nitiss, Andrejs Tokmakovs, Maris Ozolinsh, Sintija Logina
Author Affiliations +
Abstract

In recent years, phase retrieval methods recovering the phase of an object from coded diffraction patterns have gained popularity. A numerical phase retrieval method called PhaseLift that recovers the phase of an object from a very limited number of coded diffraction patterns was recently proposed. Performance of PhaseLift has been analyzed for different types and the number of masks modulating an object. We present a unique application of PhaseLift that uses four rotations of a single mask, modulating only the amplitude of an object. In simulations, a phase screen with the root-mean-square (RMS) value 0.294  μm was used as the test object. The RMS value of the retrieved phase screen after smoothing was 0.257  μm. In experiments, the RMS value of a wavefront measured with a Shack–Hartmann wavefront sensor was 0.094 while that of the retrieved wavefront after smoothing was 0.054  μm. While PhaseLift is able to recover a wavefront using this kind of modulation, a serious limitation to applicability of this method is its high computational cost and time.

© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 2329-4124/2019/$28.00 © 2019 SPIE
Varis Karitans, Edgars Nitiss, Andrejs Tokmakovs, Maris Ozolinsh, and Sintija Logina "Optical phase retrieval using four rotated versions of a single binary amplitude modulating mask," Journal of Astronomical Telescopes, Instruments, and Systems 5(3), 039004 (6 August 2019). https://doi.org/10.1117/1.JATIS.5.3.039004
Received: 3 April 2019; Accepted: 15 July 2019; Published: 6 August 2019
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavefronts

Modulation

Phase retrieval

Modulators

Zernike polynomials

Diffraction

Phase measurement

Back to Top