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6 June 2019 X-ray imaging polarimetry with a 2.5-μm pixel CMOS sensor for visible light at room temperature
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X-ray polarimetry in astronomy has not been exploited well, despite its importance. The recent innovation of instruments is changing this situation. We focus on a complementary metal–oxide–semiconductor (CMOS) pixel detector with small pixel size and employ it as an x-ray photoelectron tracking polarimeter. The CMOS detector we employ is developed by GPixel Inc. and has a pixel size of 2.5  μm  ×  2.5  μm. Although it is designed for visible light, we succeed in detecting x-ray photons with an energy resolution of 176 eV (FWHM) at 5.9 keV at room temperature and the atmospheric condition. We measure the x-ray detection efficiency and polarimetry sensitivity by irradiating polarized monochromatic x-rays at BL20B2 in SPring-8, the synchrotron radiation facility in Japan. We obtain modulation factors of 7.63  %    ±  0.07  %   and 15.5  %    ±  0.4  %   at 12.4 and 24.8 keV, respectively. It demonstrates that this sensor can be used as an x-ray imaging spectrometer and polarimeter with the highest spatial resolution ever tested.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 2329-4124/2019/$28.00 © 2019 SPIE
Kazunori Asakura, Kiyoshi Hayashida, Takashi Hanasaka, Tomoki Kawabata, Tomokage Yoneyama, Koki Okazaki, Shuntaro Ide, Hirofumi Noda, Hironori Matsumoto, Hiroshi Tsunemi, Hisamitsu Awaki, and Hiroshi Nakajima "X-ray imaging polarimetry with a 2.5-μm pixel CMOS sensor for visible light at room temperature," Journal of Astronomical Telescopes, Instruments, and Systems 5(3), 035002 (6 June 2019).
Received: 1 March 2019; Accepted: 15 May 2019; Published: 6 June 2019


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