4 February 2020 Deflectometric data segmentation for surface inspection: a fully convolutional neural network approach
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Abstract

The purpose of this paper is to explore the use of fully convolutional neural networks (FCN) to perform a semantic segmentation of deflectometric recordings for quality control of reflective surfaces. The proposed method relies on a U-net network to identify the location and boundaries of the object and the possible defective areas present on it by performing a pixel-wise classification based on local curvatures and data modulation. Experiments were performed on a real industrial problem using four variations of the architecture. The results demonstrate that the method combining geometric and photometric information enables the identification of a wider variety of shape and texture imperfections, with the resulting segmentations closely correlated with the visual impact of the defects. In addition, several suggestions are presented for near-term industrial utilization.

© 2020 SPIE and IS&T 1017-9909/2020/$28.00 © 2020 SPIE and IS&T
Daniel Maestro-Watson, Julen Balzategui, Luka Eciolaza, and Nestor Arana-Arexolaleiba "Deflectometric data segmentation for surface inspection: a fully convolutional neural network approach," Journal of Electronic Imaging 29(4), 041007 (4 February 2020). https://doi.org/10.1117/1.JEI.29.4.041007
Received: 20 August 2019; Accepted: 9 January 2020; Published: 4 February 2020
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Cited by 5 scholarly publications.
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KEYWORDS
Image segmentation

Inspection

Cameras

Modulation

Data modeling

Computer programming

Image processing

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