Journal of Electronic Imaging
VOL. 29 · NO. 4 | July 2020
ISSUES IN PROGRESS
IN PROGRESS
SPIE publishes accepted journal articles as soon as they are approved for publication. Journal issues are considered In Progress until all articles for an issue have been published. Articles published ahead of the completed issue are fully citable.
Special Section on Quality Control by Artificial Vision VI
J. Electron. Imag. 29(4), 041002 (28 December 2019)https://doi.org/10.1117/1.JEI.29.4.041002
TOPICS: Skin, Image classification, Neural networks, Injuries, Feature extraction, Data modeling, Ultraviolet radiation, Diagnostics, Algorithm development, Surgery
J. Electron. Imag. 29(4), 041003 (31 December 2019)https://doi.org/10.1117/1.JEI.29.4.041003
TOPICS: Skin, Computing systems, Image segmentation, Light sources and illumination, Picosecond phenomena, Image processing, Image acquisition, RGB color model, Calibration, Mouse models
J. Electron. Imag. 29(4), 041004 (11 January 2020)https://doi.org/10.1117/1.JEI.29.4.041004
TOPICS: Light sources, Reflectivity, Digital micromirror devices, Calibration, Spherical lenses, Visualization, Solids, Statistical analysis, Data modeling, Error analysis
J. Electron. Imag. 29(4), 041005 (20 January 2020)https://doi.org/10.1117/1.JEI.29.4.041005
TOPICS: Model-based design, Data modeling, Computer programming, Molybdenum, 3D modeling, Inspection, Lawrencium, Video, Performance modeling, Binary data
J. Electron. Imag. 29(4), 041006 (17 January 2020)https://doi.org/10.1117/1.JEI.29.4.041006
TOPICS: Polarization, Cameras, Reflection, Imaging systems, 3D acquisition, 3D modeling, Sensors, Visualization, Error analysis, Polarization analysis
J. Electron. Imag. 29(4), 041007 (4 February 2020)https://doi.org/10.1117/1.JEI.29.4.041007
TOPICS: Image segmentation, Inspection, Cameras, Modulation, Data modeling, Computer programming, LCDs, Image processing, Convolutional neural networks, Defect detection
J. Electron. Imag. 29(4), 041008 (17 February 2020)https://doi.org/10.1117/1.JEI.29.4.041008
TOPICS: Clouds, Sensors, 3D modeling, Inspection, Environmental sensing, Solid modeling, Data modeling, Computer aided design, RGB color model, Chemical elements
J. Electron. Imag. 29(4), 041009 (21 February 2020)https://doi.org/10.1117/1.JEI.29.4.041009
TOPICS: Sensors, Video, Glasses, X-rays, RGB color model, Cameras, Inspection, Optical filters, X-ray technology, Algorithm development
J. Electron. Imag. 29(4), 041010 (3 March 2020)https://doi.org/10.1117/1.JEI.29.4.041010
TOPICS: Data modeling, Neural networks, Prototyping, Image classification, Unmanned aerial vehicles, Machine learning, Defect detection, Inspection, 3D modeling, Optical inspection
J. Electron. Imag. 29(4), 041011 (5 March 2020)https://doi.org/10.1117/1.JEI.29.4.041011
TOPICS: Calibration, Polarization, Cameras, Optical filters, Polarimetry, Sensors, Image filtering, Error analysis, Imaging arrays, Radio optics
J. Electron. Imag. 29(4), 041012 (25 April 2020)https://doi.org/10.1117/1.JEI.29.4.041012
TOPICS: Clouds, 3D modeling, Inspection, Solid modeling, Computer aided design, Data modeling, 3D scanning, RGB color model, Image segmentation, Scanners
J. Electron. Imag. 29(4), 041013 (28 April 2020)https://doi.org/10.1117/1.JEI.29.4.041013
TOPICS: Inspection, X-rays, X-ray imaging, X-ray computed tomography, Feature extraction, Statistical modeling, Binary data, Neural networks, Error analysis, Defect detection
Regular Articles
J. Electron. Imag. 29(4), 043001 (6 July 2020)https://doi.org/10.1117/1.JEI.29.4.043001
TOPICS: _terms under review, RGB color model, Gallium nitride, Data modeling, Feature extraction, Image fusion, Computer programming, Convolution, Visualization, Image processing
J. Electron. Imag. 29(4), 043002 (7 July 2020)https://doi.org/10.1117/1.JEI.29.4.043002
TOPICS: _terms under review, Data modeling, Chromium, Video, Statistical modeling, Error analysis, Expectation maximization algorithms, Head, Feature extraction, Databases
J. Electron. Imag. 29(4), 043003 (9 July 2020)https://doi.org/10.1117/1.JEI.29.4.043003
TOPICS: Calibration, Cameras, _terms under review, Microlens, Image sensors, Sensors, Microlens array, Vignetting, Signal to noise ratio, RGB color model
J. Electron. Imag. 29(4), 043004 (10 July 2020)https://doi.org/10.1117/1.JEI.29.4.043004
TOPICS: _terms under review, Defect detection, Magnetism, Convolution, Image processing, Convolutional neural networks, Inspection, Image enhancement, Data modeling, Performance modeling
J. Electron. Imag. 29(4), 043005 (10 July 2020)https://doi.org/10.1117/1.JEI.29.4.043005
TOPICS: _terms under review, Denoising, Convolution, Feature extraction, Image denoising, Performance modeling, Image filtering, Signal to noise ratio, Visualization, Image segmentation
J. Electron. Imag. 29(4), 043006 (15 July 2020)https://doi.org/10.1117/1.JEI.29.4.043006
TOPICS: _terms under review, Image restoration, Image fusion, Image transmission, Signal attenuation, Image enhancement, Light scattering, Scattering, Light sources, Absorption
J. Electron. Imag. 29(4), 043007 (16 July 2020)https://doi.org/10.1117/1.JEI.29.4.043007
TOPICS: _terms under review, Video, Digital watermarking, Cameras, Binary data, Detection and tracking algorithms, Steganography, Signal processing, Speckle, Video compression
J. Electron. Imag. 29(4), 043008 (17 July 2020)https://doi.org/10.1117/1.JEI.29.4.043008
TOPICS: Light emitting diodes, _terms under review, Cameras, Reflectivity, Sensors, Seaborgium, Optical filters, Error analysis, Calibration, LED lighting
J. Electron. Imag. 29(4), 043009 (20 July 2020)https://doi.org/10.1117/1.JEI.29.4.043009
TOPICS: _terms under review, Visualization, Image segmentation, Convolutional neural networks, Neural networks, Detection and tracking algorithms, Optical character recognition, Feature extraction, Surveillance, Image classification
J. Electron. Imag. 29(4), 043010 (20 July 2020)https://doi.org/10.1117/1.JEI.29.4.043010
TOPICS: _terms under review, Image restoration, Air contamination, Image fusion, Atmospheric modeling, Denoising, Image processing, Light sources, Lithium, Scattering
J. Electron. Imag. 29(4), 043011 (21 July 2020)https://doi.org/10.1117/1.JEI.29.4.043011
TOPICS: Image quality, _terms under review, Databases, Visualization, Feature extraction, Distortion, Image processing, Image fusion, Image visualization, Remote sensing
J. Electron. Imag. 29(4), 043012 (24 July 2020)https://doi.org/10.1117/1.JEI.29.4.043012
TOPICS: _terms under review, Sensors, Feature extraction, Testing and analysis, Stars, Statistical modeling, Solids, Mirrors, Light sources and illumination, Target detection
J. Electron. Imag. 29(4), 043013 (27 July 2020)https://doi.org/10.1117/1.JEI.29.4.043013
TOPICS: Detection and tracking algorithms, Target detection, _terms under review, Submerged target detection, Feature extraction, Submerged target modeling, Image enhancement, Robots, Oceanography, Environmental sensing
J. Electron. Imag. 29(4), 043014 (28 July 2020)https://doi.org/10.1117/1.JEI.29.4.043014
TOPICS: _terms under review, Feature extraction, Lithium, Cameras, Data modeling, Image processing, Performance modeling, Convolution, Mining, Machine vision
J. Electron. Imag. 29(4), 043015 (30 July 2020)https://doi.org/10.1117/1.JEI.29.4.043015
TOPICS: _terms under review, Matrices, Chromium, Image classification, Optimization (mathematics), Distance measurement, Detection and tracking algorithms, Machine vision, Pattern recognition, Data modeling
J. Electron. Imag. 29(4), 043016 (3 August 2020)https://doi.org/10.1117/1.JEI.29.4.043016
TOPICS: _terms under review, Image enhancement, Image filtering, Medical imaging, Fractal analysis, Video, Filtering (signal processing), Digital filtering, Image processing, Surface plasmons
J. Electron. Imag. 29(4), 043017 (4 August 2020)https://doi.org/10.1117/1.JEI.29.4.043017
TOPICS: _terms under review, Long wavelength infrared, Image registration, Infrared radiation, Infrared imaging, Visible radiation, Sensors, Image filtering, Feature extraction, Gaussian filters
J. Electron. Imag. 29(4), 043018 (4 August 2020)https://doi.org/10.1117/1.JEI.29.4.043018
TOPICS: _terms under review, Matrices, Image classification, Feature extraction, Lab on a chip, Light emitting diodes, Facial recognition systems, Vector spaces, Data modeling, Visualization
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