12 November 2015 Semiautomatic classification of cementitious materials using scanning electron microscope images
Lucas Drumetz, Mauro D. Mura, Samuel Meulenyzer, Sébastien Lombard, Jocelyn Chanussot
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Abstract
Segmentation and classification are prolific research topics in the image processing community. These topics have been increasingly used in the context of analysis of cementitious materials on images acquired with a scanning electron microscope. Indeed, there is a need to be able to detect and to quantify the materials present in a cement paste in order to follow the chemical reactions occurring in the material even days after the solidification. We propose a new approach for segmentation and classification of cementitious materials based on the denoising of the data with a block-matching three-dimensional (3-D) algorithm, binary partition tree (BPT) segmentation, support vector machines (SVM) classification, and interactivity with the user. The BPT provides a hierarchical representation of the spatial regions of the data, allowing a segmentation to be selected among the admissible partitions of the image. SVMs are used to obtain a classification map of the image. This approach combines state-of-the-art image processing tools with user interactivity to allow a better segmentation to be performed, or to help the classifier discriminate the classes better. We show that the proposed approach outperforms a previous method when applied to synthetic data and several real datasets coming from cement samples, both qualitatively with visual examination and quantitatively with the comparison of experimental results with theoretical ones.
© 2015 SPIE and IS&T 1017-9909/2015/$25.00 © 2015 SPIE and IS&T
Lucas Drumetz, Mauro D. Mura, Samuel Meulenyzer, Sébastien Lombard, and Jocelyn Chanussot "Semiautomatic classification of cementitious materials using scanning electron microscope images," Journal of Electronic Imaging 24(6), 061109 (12 November 2015). https://doi.org/10.1117/1.JEI.24.6.061109
Published: 12 November 2015
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CITATIONS
Cited by 11 scholarly publications.
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KEYWORDS
Image segmentation

Cements

Image classification

Scanning electron microscopy

Image processing

X-rays

Electron microscopes

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