Optical Engineering
VOL. 19 · NO. 2 | April 1980
CONTENTS
IN THIS ISSUE

Journal Articles
R. Johnson
Optical Engineering, Vol. 19, Issue 2, 190238, (April 1980) https://doi.org/10.1117/12.7972504
Open Access
H. Caulfield
Optical Engineering, Vol. 19, Issue 2, 190336, (April 1980) https://doi.org/10.1117/12.7972485
Open Access
TOPICS: Optical engineering
Andrew Tescher, David Casasent
Optical Engineering, Vol. 19, Issue 2, 192151, (April 1980) https://doi.org/10.1117/12.7972486
Open Access
TOPICS: Digital signal processing, Digital image processing, Data processing
H. Caulfield, R. Haimes, David Casasent
Optical Engineering, Vol. 19, Issue 2, 192152, (April 1980) https://doi.org/10.1117/12.7972487
TOPICS: Optical pattern recognition
Dale Ausherman
Optical Engineering, Vol. 19, Issue 2, 192157, (April 1980) https://doi.org/10.1117/12.7972488
TOPICS: Synthetic aperture radar, Data processing, Image acquisition, Digital signal processing, Optical signal processing, Convolution, Multiplexing
William Green, Nevin Bryant, Paul Jepsen,, Ronald McLeod, Joel Mosher, Robert Selzer, William Stromberg, Gary Yagi, Albert Zobrist
Optical Engineering, Vol. 19, Issue 2, 192168, (April 1980) https://doi.org/10.1117/12.7972489
TOPICS: Image processing, Space operations, Image analysis, Astatine, Mars, Sensors, Digital signal processing, Digital image processing, Venus, Mercury (planet)
J. Mantock, A. Sawchuk, T. Strand
Optical Engineering, Vol. 19, Issue 2, 192180, (April 1980) https://doi.org/10.1117/12.7972490
TOPICS: Hybrid optics, Image analysis, Digital Light Processing, Spatial frequencies, Clouds, Earth observing sensors, Satellites, Photography
E. Hall, J. Hwang, C. Lee, M. Hwang
Optical Engineering, Vol. 19, Issue 2, 192186, (April 1980) https://doi.org/10.1117/12.7972491
TOPICS: 3D image processing, Error analysis
Demetri Psaltis, David Casasent
Optical Engineering, Vol. 19, Issue 2, 192193, (April 1980) https://doi.org/10.1117/12.7972492
TOPICS: Optical signal processing
B. Reddersen, L. Ralston
Optical Engineering, Vol. 19, Issue 2, 192199, (April 1980) https://doi.org/10.1117/12.7972493
TOPICS: Data storage, Optical storage, Holography, Digital holography, Holographic data storage systems, Satellites, Landsat, Earth observing sensors
John Neff
Optical Engineering, Vol. 19, Issue 2, 192205, (April 1980) https://doi.org/10.1117/12.7972494
TOPICS: Signal processing, Image processing, Scientific research, Optical signal processing, Parallel processing
Roger Malina, Stuart Bowyer, David Finley, Webster Cash
Optical Engineering, Vol. 19, Issue 2, 192211, (April 1980) https://doi.org/10.1117/12.7972495
TOPICS: Extreme ultraviolet, Telescopes, Spectroscopy, EUV optics, Aluminum, Diamond, Nickel, Surface finishing, Polishing, Gold
L. Rider
Optical Engineering, Vol. 19, Issue 2, 192219, (April 1980) https://doi.org/10.1117/12.7972496
TOPICS: Satellites, Target detection, Sensors
James Palmer
Optical Engineering, Vol. 19, Issue 2, 192224, (April 1980) https://doi.org/10.1117/12.7972497
TOPICS: Radiometry, Solar energy, Space operations, Solar radiation, Channel projecting optics, Optical filters, Silicon, Germanium, Photovoltaic detectors, Sensors
Atsuya Seko, Hiroshi Kobayashi, Kenichi Shimizu
Optical Engineering, Vol. 19, Issue 2, 192229, (April 1980) https://doi.org/10.1117/12.7972498
TOPICS: Image intensifiers, Image processing, Channel projecting optics
Joseph Geary
Optical Engineering, Vol. 19, Issue 2, 192233, (April 1980) https://doi.org/10.1117/12.7972499
TOPICS: Reconnaissance, Temperature metrology, Reconnaissance systems, Lenses
J. Van Daele, A. Oosterlinck, H. Van den Berghe
Optical Engineering, Vol. 19, Issue 2, 192240, (April 1980) https://doi.org/10.1117/12.7972500
TOPICS: Optical inspection, Switches, Feature extraction, Manufacturing, Control systems, Image processing, Pattern recognition, Reliability, Inspection, Prototyping
Yoichi Fujii, Fumio Matsumura
Optical Engineering, Vol. 19, Issue 2, 192245, (April 1980) https://doi.org/10.1117/12.7972501
TOPICS: Absorption, Fourier transforms, Gases, Molecules, Air contamination
Robert Noll
Optical Engineering, Vol. 19, Issue 2, 192249, (April 1980) https://doi.org/10.1117/12.7972502
TOPICS: Scattering, X-ray imaging, X-rays, Surface finishing, Imaging systems, Systems modeling, Scatter measurement, Spatial frequencies, Polishing, Image quality
Christina Johnson, F. Low, Arnold Davidson
Optical Engineering, Vol. 19, Issue 2, 192255, (April 1980) https://doi.org/10.1117/12.7972503
TOPICS: Germanium, Bolometers, Diamond, Astatine, Infrared sensors, Sensors, Far infrared
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