Optical Engineering
VOL. 19 · NO. 5 | October 1980
CONTENTS
IN THIS ISSUE

Journal Articles
H. Caulfield
Optical Engineering, Vol. 19, Issue 5, 195140, (October 1980) https://doi.org/10.1117/12.7972577
Open Access
TOPICS: Optical engineering, Fourier transforms, Speckle interferometry, Atmospheric optics, Image retrieval
W. Hyzer
Optical Engineering, Vol. 19, Issue 5, 195142, (October 1980) https://doi.org/10.1117/12.7972606
Open Access
TOPICS: Photography, Motion analysis
James Wyant, Chungte Chen, George Reynolds
Optical Engineering, Vol. 19, Issue 5, 195631, (October 1980) https://doi.org/10.1117/12.7972579
TOPICS: Holography, Optical engineering, Coherent optics
E. Leith
Optical Engineering, Vol. 19, Issue 5, 195633, (October 1980) https://doi.org/10.1117/12.7972580
TOPICS: Holography
P. Hariharan
Optical Engineering, Vol. 19, Issue 5, 195636, (October 1980) https://doi.org/10.1117/12.7972581
TOPICS: Holography, Holographic materials, Silver, Photography
B. Chang
Optical Engineering, Vol. 19, Issue 5, 195642, (October 1980) https://doi.org/10.1117/12.7972582
TOPICS: Holograms, Holographic optical elements, Holography applications, Scattering, Holography, Absorption, Glasses, Refractive index, Modulation, Image resolution
Chungte Chen
Optical Engineering, Vol. 19, Issue 5, 195649, (October 1980) https://doi.org/10.1117/12.7972583
TOPICS: Optical design, Holographic optical elements, Optical components
C. Vest
Optical Engineering, Vol. 19, Issue 5, 195654, (October 1980) https://doi.org/10.1117/12.7972584
TOPICS: Holographic interferometry, Holography, Diagnostics
A. Friesem, Y. Katzir, Z. Rav-Noy, B. Sharon
Optical Engineering, Vol. 19, Issue 5, 195659, (October 1980) https://doi.org/10.1117/12.7972585
TOPICS: Holography, Nondestructive evaluation, Signal to noise ratio, Holography applications, Holograms
F. Yu, Anthony Tai, Hsuan Chen
Optical Engineering, Vol. 19, Issue 5, 195666, (October 1980) https://doi.org/10.1117/12.7972586
TOPICS: Holography, Holographic interferometry, Image processing, Holograms, Speckle, Visibility, Fringe analysis
John Loomis
Optical Engineering, Vol. 19, Issue 5, 195679, (October 1980) https://doi.org/10.1117/12.7972587
TOPICS: Computer generated holography, Optical testing, Holograms, Interferometers, Geometrical optics, Wavefronts, Computer programming, Optical design, Holographic interferometry
Stephen Benton
Optical Engineering, Vol. 19, Issue 5, 195686, (October 1980) https://doi.org/10.1117/12.7972588
TOPICS: Holography, 3D image processing, Holograms
Lloyd Huff, Richard Fusek
Optical Engineering, Vol. 19, Issue 5, 195691, (October 1980) https://doi.org/10.1117/12.7972589
TOPICS: Holography, Stereo holograms, Holograms
Juris Upatnieks, James Embach
Optical Engineering, Vol. 19, Issue 5, 195696, (October 1980) https://doi.org/10.1117/12.7972590
TOPICS: Holograms, Projection systems, Image display, Optical design, Holography, Image quality, Lamps, Light sources, Speckle
B. Hildebrand, Steven Doctor
Optical Engineering, Vol. 19, Issue 5, 195705, (October 1980) https://doi.org/10.1117/12.7972591
TOPICS: Holography, 3D image reconstruction
Steven Case, Volker Gerbig
Optical Engineering, Vol. 19, Issue 5, 195711, (October 1980) https://doi.org/10.1117/12.7972592
TOPICS: 3D scanning, Volume holography, Holograms, Laser scanners, Scanners, Holography, Diffraction, Materials processing
David Casasent, Frank Caimi, Joseph Hinds
Optical Engineering, Vol. 19, Issue 5, 195716, (October 1980) https://doi.org/10.1117/12.7972593
TOPICS: Optical pattern recognition, Optical correlators, Spatial filters, Holography
J. Trolinger
Optical Engineering, Vol. 19, Issue 5, 195722, (October 1980) https://doi.org/10.1117/12.7972594
TOPICS: Holography, Diagnostics, Holograms, Particles, Optical design
S. Cartwright, P. Dunn, B. Thompson
Optical Engineering, Vol. 19, Issue 5, 195727, (October 1980) https://doi.org/10.1117/12.7972595
TOPICS: Holography, Particle sizing, Particles
Kendall Carder, Dennis Meyers
Optical Engineering, Vol. 19, Issue 5, 195734, (October 1980) https://doi.org/10.1117/12.7972596
TOPICS: Particles, Holography, Minerals, Holograms, Optical spheres
Guy Lebreton, Eric Bazelaire
Optical Engineering, Vol. 19, Issue 5, 195739, (October 1980) https://doi.org/10.1117/12.7972597
TOPICS: Antennas, Signal processing, Holography, Imaging devices, Raster graphics, Optical filters, Electronic filtering, Doppler effect, Coherence imaging, Data processing
M. McDowell, H. Klee
Optical Engineering, Vol. 19, Issue 5, 195748, (October 1980) https://doi.org/10.1117/12.7972598
TOPICS: Thermography, Infrared radiation, Germanium, Sensors, Monochromatic aberrations, Chromatic aberrations, Imaging systems, Optical properties
C. Carrison, N. Foss
Optical Engineering, Vol. 19, Issue 5, 195753, (October 1980) https://doi.org/10.1117/12.7972599
TOPICS: Infrared radiation, Infrared imaging, Sensors, Imaging systems, Electronics, Digital electronics, Staring arrays
J. Berry, J. Yoo
Optical Engineering, Vol. 19, Issue 5, 195758, (October 1980) https://doi.org/10.1117/12.7972600
TOPICS: Sensors, Distortion, Image sensors
Firooz Sadjadi, Ernest Hall
Optical Engineering, Vol. 19, Issue 5, 195764, (October 1980) https://doi.org/10.1117/12.7972601
TOPICS: Image registration
Che-Kuang Wu
Optical Engineering, Vol. 19, Issue 5, 195769, (October 1980) https://doi.org/10.1117/12.7972602
TOPICS: Silicate glass, Glasses, Polarization, Laser processing, Optical recording, Crystals, Nondestructive evaluation, Near infrared, Polarizers
David Swain
Optical Engineering, Vol. 19, Issue 5, 195777, (October 1980) https://doi.org/10.1117/12.7972603
TOPICS: Particles, Far-field diffraction, Diamond, Water, Refractive index
D. Gnanamuthu
Optical Engineering, Vol. 19, Issue 5, 195783, (October 1980) https://doi.org/10.1117/12.7972604
TOPICS: Cladding, Laser surface treatment, Carbon dioxide lasers, Surface properties, Continuous wave operation, X-ray lasers, X-rays, Laser therapeutics, Ceramics, Laser processing
Fred Dickey, Mark Petersen
Optical Engineering, Vol. 19, Issue 5, 195793, (October 1980) https://doi.org/10.1117/12.7972605
TOPICS: Fourier optics, Sensors, Far-field diffraction, Diffraction, Translucency, Inspection
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