Optical Engineering
VOL. 28 · NO. 3 | March 1989
CONTENTS
IN THIS ISSUE

Journal Articles
Opt. Eng. 28(3), 283201 (1 March 1989)https://doi.org/10.1117/12.7976935
TOPICS: Very large scale integration, Optical interconnects, Laser stabilization, Semiconductor lasers, Holography, Laser damage threshold, Computer networks, Optical networks, Computer generated holography, Computing systems
Opt. Eng. 28(3), 283212 (1 March 1989)https://doi.org/10.1117/12.7976936
TOPICS: Fiber optics tests, Optical testing, Data analysis, Fiber optics, Optical fibers
Opt. Eng. 28(3), 283217 (1 March 1989)https://doi.org/10.1117/12.7976937
TOPICS: Interferometry, X-ray optics, Data analysis
Opt. Eng. 28(3), 283222 (1 March 1989)https://doi.org/10.1117/12.7976938
TOPICS: Luminescence, Microscopy, Chemistry, Genetics, Mode conditioning cables, Parallel computing, Liver, Statistical methods, Statistical analysis, Resistance
Opt. Eng. 28(3), 283232 (1 March 1989)https://doi.org/10.1117/12.7976939
TOPICS: Reconstruction algorithms, Image compression
Opt. Eng. 28(3), 283241 (1 March 1989)https://doi.org/10.1117/12.7976940
TOPICS: Cameras, Imaging systems, Optical properties, Electro optics, Lenses, Optical filters, Absorption
Opt. Eng. 28(3), 283248 (1 March 1989)https://doi.org/10.1117/12.7976941
TOPICS: Optical discs, Radiation effects, Ionizing radiation, Gamma radiation, Electrons, Magneto-optics, Silicon, Optoelectronics, Particles
Opt. Eng. 28(3), 283255 (1 March 1989)https://doi.org/10.1117/12.7976942
TOPICS: Reflectivity, Chemical analysis, Biomedical optics, Radio optics, Statistical analysis, Radiometry, Medical diagnostics, Temporal resolution
Opt. Eng. 28(3), 283261 (1 March 1989)https://doi.org/10.1117/12.7976943
TOPICS: Holographic interferometry, Holography, Nondestructive evaluation, Deflectometry, Moire patterns, Defect detection, Reliability
Opt. Eng. 28(3), 283267 (1 March 1989)https://doi.org/10.1117/12.7976944
TOPICS: Optical correlators, Image filtering, Phase only filters, Binary data, Joint transforms
Opt. Eng. 28(3), 283273 (1 March 1989)https://doi.org/10.1117/12.7976945
TOPICS: Diffraction, Scatter measurement, Point spread functions, Gaussian beams, Monochromatic aberrations, Bidirectional reflectance transmission function, Americium, Numerical analysis
Opt. Eng. 28(3), 283281 (1 March 1989)https://doi.org/10.1117/12.7976946
TOPICS: Diamond, Laser damage threshold, Silicon films, Silicon, Semiconductor lasers, Resistance, Optical components, Laser optics, Laser systems engineering, Laser induced damage
Opt. Eng. 28(3), 283286 (1 March 1989)https://doi.org/10.1117/12.7976947
TOPICS: Modulation, Optical testing, Americium, Photodetectors, Microscopes, Visual analytics, Visualization, Error analysis
Opt. Eng. 28(3), 283290 (1 March 1989)https://doi.org/10.1117/12.7976948
TOPICS: Thin films, Optical recording, Laser crystals, Astatine, Crystals, Transmittance, Selenium, Diffraction, Holography, Diffraction gratings
Opt. Eng. 28(3), 283297 (1 March 1989)https://doi.org/10.1117/12.7976934
Opt. Eng. 28(3), 283298 (1 March 1989)https://doi.org/10.1117/12.7976949
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