Optical Engineering
VOL. 33 · NO. 5 | May 1994

Articles (51)
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.181747
TOPICS: Optical engineering, X-ray optics, Optics, Roads, Computing systems, Electronics engineering, Cameras, Adaptive optics, Physics, Optical pattern recognition
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.181748
TOPICS: Sensors, Mercury cadmium telluride, Semiconductors, Imaging systems, Photodiodes, Infrared detectors, Thermography, Quantum well infrared photodetectors, Silicon, Quantum wells
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165821
TOPICS: Mercury cadmium telluride, Sensors, Photodiodes, Infrared detectors, Semiconductors, Infrared sensors, Silicon, Thermography, Quantum well infrared photodetectors, Photoresistors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165795
TOPICS: Photodetectors, Sensors, Semiconductors, Photoresistors, Doping, Thermography, Quantum efficiency, Lenses, Signal processing, Magnetic semiconductors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165818
TOPICS: Mercury cadmium telluride, Diodes, Long wavelength infrared, Diffusion, Staring arrays, Heterojunctions, Arsenic, Photovoltaic detectors, Information operations, Infrared detectors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165799
TOPICS: Diodes, Photodiodes, Diffusion, Semiconductors, Electrons, Resistance, Instrument modeling, Sensors, Semiconducting wafers, Infrared detectors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165820
TOPICS: Photodiodes, Mercury cadmium telluride, Mid-IR, Arsenic, Quantum efficiency, Diffusion, Doping, Infrared radiation, Infrared photography, Diodes
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165808
TOPICS: Silicon, Sensors, Photovoltaics, Infrared sensors, Lead, Thermography, Epitaxy, Staring arrays, Temperature metrology, X-rays
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.167103
TOPICS: Crystals, Silicon, Glasses, Silicon films, Lead, Interfaces, Semiconductors, Information operations, Photodetectors, Infrared detectors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165816
TOPICS: Image sensors, Sensors, Infrared sensors, Infrared imaging, Signal detection, Thermography, Charge-coupled devices, Capacitance, Electrons, Silicon
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165817
TOPICS: Quantum well infrared photodetectors, Sensors, Quantum wells, Gallium arsenide, Electrons, Infrared radiation, Infrared sensors, Photodetectors, Infrared detectors, Resistance
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165809
TOPICS: Quantum wells, Sensors, Germanium, Absorption, Silicon, Polarization, Photodetectors, Doping, Infrared detectors, Quantum efficiency
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165819
TOPICS: Photodiodes, Mercury cadmium telluride, Quantum well infrared photodetectors, Sensors, Quantum wells, Long wavelength infrared, Photoresistors, Diffusion, Gallium arsenide, Temperature metrology
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165801
TOPICS: Sensors, Detector arrays, Electric field sensors, Switches, Infrared detectors, Semiconductors, Infrared sensors, Photoresistors, Signal detection, Photodetectors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.167104
TOPICS: Sensors, Spectroscopy, Germanium, Calibration, Photoresistors, Signal detection, Field effect transistors, Infrared sensors, Electronics, Crystals
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168372
TOPICS: Semiconductors, Multilayers, Coating, Reflection, Refractive index, Radiation effects, Absorption, Polarization, Thin films, Photodetectors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.181751
TOPICS: Optical interconnects, Packaging, Waveguides, Optoelectronics, Free space optics, Computer aided design, Telecommunications, Optical fibers, Optical networks, Multiplexing
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.166527
TOPICS: Asynchronous transfer mode, Switches, Switching, Optical signal processing, Gallium arsenide, Packaging, Free space optics, Optical interconnects, Packet switching, Optoelectronic devices
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.170723
TOPICS: Receivers, Transmitters, Free space optics, Optical interconnects, Sensors, Computing systems, Telecommunications, Near field optics, Micropositioners, Data processing
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.166526
TOPICS: Switching, Free space optics, Multiplexing, Switches, Electroluminescence, Optical interconnects, Electronic filtering, Electronics, Optical communications, Network architectures
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.166529
TOPICS: Polarization, Interfaces, Beam splitters, Imaging systems, Collimation, Coating, Reflection, Jones calculus, Refractive index, Wave propagation
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.166528
TOPICS: Diffraction, Gaussian beams, Micro optics, Lithography, Diffraction gratings, Beam propagation method, Tolerancing, Collimation, Light, Optical components
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168412
TOPICS: Glasses, Computer generated holography, Sensors, Packaging, Thermal effects, Optical interconnects, Optical alignment, Thermography, Tolerancing, Free space optics
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168398
TOPICS: Computer aided design, Optoelectronics, Computer generated holography, Optical design, CAD systems, Computing systems, Photonic integrated circuits, Optical components, Computer architecture, Human-machine interfaces
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.166525
TOPICS: Waveguides, Channel waveguides, Light sources, Polymers, Signal to noise ratio, Optical interconnects, Channel projecting optics, Polymer multimode waveguides, Wave propagation, Cladding
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168376
TOPICS: Waveguides, Clocks, Silica, Channel waveguides, Glasses, Directional couplers, Optical design, Computing systems, Signal attenuation, Optical interconnects
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168381
TOPICS: Interference (communication), Waveguides, Signal to noise ratio, Signal attenuation, Computer simulations, Device simulation, Photonic integrated circuits, Detection and tracking algorithms, Channel waveguides, Sensors
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168435
TOPICS: Birefringence, Polarization, Phase shifting, Phase measurement, Error analysis, Linear polarizers, Phase shifts, Wave plates, CCD cameras, Optical components
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168418
TOPICS: Target detection, Joint transforms, Optical correlators, Binary data, Apodization, Fourier transforms, Spatial light modulators, Charge-coupled devices, Computer simulations, Electronic filtering
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.163130
TOPICS: 3D displays, 3D image processing, Visualization, Error analysis, 3D vision, Control systems, Data processing, Information visualization, Eye, CRTs
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164609
TOPICS: Image segmentation, Forward looking infrared, Stochastic processes, Image processing algorithms and systems, Image processing, Automatic target recognition, Infrared imaging, Digital image processing, Electronics engineering, Thermal modeling
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164606
TOPICS: Fringe analysis, Error analysis, Phase shift keying, Modulation, Algorithm development, Digital holography, Interferometry, Visibility, Moire patterns, Holography
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168432
TOPICS: Laser stabilization, Absorption, Modulation, Heterodyning, Semiconductor lasers, Spectroscopy, Signal detection, Interferometers, Frequency modulation, Laser development
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164326
TOPICS: Neural networks, Feature extraction, Classification systems, Image classification, Image processing, Machine learning, Image segmentation, Imaging systems, Video, Image analysis
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164603
TOPICS: Neurons, Diffractive optical elements, Neural networks, Wigner distribution functions, Holograms, Binary data, Detector arrays, Artificial neural networks, Optical components, Optical engineering
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164329
TOPICS: Glasses, Optical filters, Absorption, Transmittance, Color centers, Radiation effects, Aerospace engineering, Electrons, Crystals, Information operations
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168427
TOPICS: Refractive index, Wave propagation, Thin films, Waveguides, Prisms, Anisotropy, Polarization, Optical coatings, Signal attenuation, Ions
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168540
TOPICS: Reflectors, Systems modeling, Ray tracing, Aspheric lenses, Optical design, Spherical lenses, Optical spheres, Software development, Chemical elements, Fluctuations and noise
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164613
TOPICS: Electrons, Inspection, Electron beams, Photomicroscopy, Semiconducting wafers, Transistors, Molybdenum, Scanning electron microscopy, Semiconductors, Oxides
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168542
TOPICS: Ruby lasers, Q switched lasers, Q switches, Camera shutters, High speed photography, Photography, Speckle, Light sources, Pulsed laser operation, Modulators
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168543
TOPICS: Cameras, Photography, Speckle, Mirrors, Control systems, Ruby lasers, Fringe analysis, Speckle pattern, Photodetectors, Deflectometry
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164328
TOPICS: Digital filtering, Image filtering, Electronic filtering, Fringe analysis, Speckle, Speckle pattern, Interferometry, Software development, Evolutionary algorithms, Image processing
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164327
TOPICS: Fringe analysis, Speckle pattern, Interferometry, Denoising, Pulsed laser operation, CCD cameras, Cameras, Speckle, Charge-coupled devices, Modulation
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164325
TOPICS: Electrodes, Modulators, Waveguides, Refractive index, Signal attenuation, Electro optics, Planar waveguides, Electro optical modeling, Electrooptic modulators, Modulation
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.164383
TOPICS: Reflectivity, X-rays, Plasma, Reflectometry, Monochromators, Mirrors, Grazing incidence, Diffraction gratings, X-ray sources, Pulsed laser operation
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.165822
TOPICS: Moire patterns, Photography, Speckle, Interferometry, Interferometers, Imaging systems, High speed photography, Video, Cameras, Communication engineering
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/12.168429
TOPICS: Speckle interferometry, Image processing, Interferometry, Speckle, Data communications, Interferometers, Image resolution, Communication engineering, Mechanical engineering, Product engineering
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/1.OE.33.5.comment1
Opt. Eng. 33(5), (1 May 1994)https://doi.org/10.1117/1.OE.33.5.response1
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