Optical Engineering
VOL. 33 · NO. 8 | August 1994

Articles (48)
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.189556
TOPICS: Optical engineering, X-ray optics, Roads, Optics, Image processing, Communication engineering, Visual optics, Nanostructures, Polymers, Atomic, molecular, and optical physics
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176513
TOPICS: Crystals, Thallium, Acousto-optics, Tunable filters, Crystallography, Acoustics, Polishing, Infrared radiation, Crystal optics, Beam propagation method
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176505
TOPICS: Wavelets, Doppler effect, Radar, Synthetic aperture radar, Image resolution, Radar imaging, Algorithm development, Reconstruction algorithms, Matrices, Surveillance systems
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173573
TOPICS: Image fusion, Data fusion, Photography, Sensors, Spectral resolution, Modulation, Multispectral imaging, Image sensors, Reflectivity, Earth observing sensors
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177108
TOPICS: Interfaces, Thin films, Reflection, Reflectivity, Beryllium, Silicon films, Tungsten, Dielectrics, Optical fibers, Amorphous silicon
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173566
TOPICS: Scintillation, Space operations, Sensors, Electronic filtering, Relays, Mirrors, Nd:YAG lasers, Space telescopes, Telescopes, Backscatter
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173588
TOPICS: Charge-coupled devices, Quantum efficiency, Ultraviolet radiation, Sensors, Photodiodes, Silicon, Calibration, Coating, Monochromators, Mirrors
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173580
TOPICS: Motion estimation, Computer programming, Distortion, Motion models, Performance modeling, Signal to noise ratio, Motion measurement, Signal processing, Instrumentation control, Control systems
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173591
TOPICS: Image processing, Image compression, Algorithm development, Data compression, Image filtering, Reconstruction algorithms, Sensors, Visualization, Hyperspectral imaging, Image quality
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177116
TOPICS: Wavelets, Image compression, Quantization, Signal to noise ratio, Computer programming, Image processing, Image quality standards, Wavelet transforms, Data processing, Receivers
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176512
TOPICS: Optical components, Chemical elements, Diffraction, Binary data, Diffraction gratings, Modulation, Fourier transforms, Optical lithography, Lithography, Lithographic illumination
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177118
TOPICS: Imaging systems, Temperature metrology, Black bodies, Image filtering, Signal detection, Optical turbulence, Aerosols, Signal attenuation, Modulation transfer functions, Electronic filtering
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177113
TOPICS: Optical fibers, Silicon, Optical alignment, Coating, Semiconducting wafers, Microscopes, Fusion splicing, Fiber coatings, Optoelectronic devices, Telecommunications
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177101
TOPICS: Luminescence, Imaging spectroscopy, Picosecond phenomena, Fluorescence spectroscopy, Teeth, Pulsed laser operation, Skin, Spectroscopy, Medical diagnostics, Dental caries
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173571
TOPICS: Raman spectroscopy, Proteins, Molecules, Luminescence, Molecular lasers, Monochromators, NOx, Physics, Chemistry, Biology
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176510
TOPICS: Polarization, Interfaces, Refractive index, Reflectivity, Beam propagation method, Fourier transforms, Refraction, Human-machine interfaces, Wave propagation, Physics
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177115
TOPICS: Image filtering, Image segmentation, Optical filters, Image classification, Image compression, Bandpass filters, Optimal filtering, Visual process modeling, Gaussian filters, Spatial frequencies
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173577
TOPICS: Image quality, Monochromatic aberrations, Modulation transfer functions, Eye, Visualization, Spatial frequencies, Quality measurement, Point spread functions, Image visualization, Video
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173570
TOPICS: Ferroelectric materials, Rubidium, Potassium, Ion exchange, Waveguides, Cesium, Crystals, Ions, Silver, Birefringence
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173559
TOPICS: Interferometers, Analog electronics, Computer programming, Electrodes, Integrated optics, Sensors, Pulsed laser operation, Signal detection, Electro optics, Modulation
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173578
TOPICS: Moire patterns, Fringe analysis, Deflectometry, Fourier transforms, Diffraction gratings, Image processing, Composites, Cameras, Mechanical engineering, Statistical analysis
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177106
TOPICS: Deflectometry, Fringe analysis, Interferometry, Mirrors, Diffraction gratings, Wavefronts, Diffraction, Optical filters, Cameras, Optical testing
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173555
TOPICS: Crystals, Holographic interferometry, Holograms, Holography, Mirrors, Ferroelectric materials, Diffraction, Polarization, Signal processing, Laser crystals
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173575
TOPICS: Temperature metrology, Absorption, Spectrophotometry, Photography, Interferometers, Interferometry, Diffraction gratings, Refraction, Fringe analysis, Deflectometry
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173590
TOPICS: Glasses, Wave plates, Interferometers, CCD image sensors, Fizeau interferometers, Phase conjugation, Aluminum, Lenses, Ferroelectric materials, Phase interferometry
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173562
TOPICS: Fiber optics, Fiber optic gyroscopes, Interferometers, Temperature metrology, Fiber optics tests, Phase shifts, Optical fibers, Signal detection, Aluminum, Tin
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173567
TOPICS: Wavefronts, Shearing interferometers, Mirrors, Microlens, Interferometry, Phase shifts, Phase measurement, Molybdenum, Interferometers, Ferroelectric materials
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173558
TOPICS: Titanium, Ions, Nickel, Chromium, Iron, Lasers, Plasma, Vanadium, Cobalt, Calcium
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173574
TOPICS: Semiconductor lasers, Resonators, Interferometry, Light sources, Ranging, Laser resonators, Laser stabilization, Laser systems engineering, Helium neon lasers, Tunable lasers
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173576
TOPICS: Semiconductor lasers, Intermodulation, Modulation, Distortion, Multiplexing, Particle filters, Video, Amplitude modulation, Fiber optics, Frequency modulation
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173544
TOPICS: Liquid crystals, Polarizers, Modulation, Video, Phase shift keying, Mathematical modeling, Optical signal processing, Phase modulation, Projection systems, Birefringence
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173552
TOPICS: Image classification, Binary data, Feature extraction, Feature selection, Image segmentation, Signal to noise ratio, Library classification systems, Statistical analysis, Image processing, Interference (communication)
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173563
TOPICS: Neural networks, Algorithms, Stochastic processes, Neurons, Interference (communication), Data modeling, Evolutionary algorithms, Statistical modeling, Error analysis, Chemical elements
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173579
TOPICS: Neural networks, Reflectivity, Inspection, Error analysis, Optical inspection, Visualization, Spectrophotometry, Agriculture, Library classification systems, Analytical research
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173565
TOPICS: Polarizers, Polarization, Phase shifts, Interferometry, Fringe analysis, 3D metrology, Speckle pattern, Nondestructive evaluation, Prisms, Error analysis
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173587
TOPICS: Stars, Charge-coupled devices, Detection and tracking algorithms, Sensors, Electro optical systems, Electro optics, CCD image sensors, Imaging systems, Computing systems, Computer simulations
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173556
TOPICS: Glucose, Polarimetry, Blood, Active optics, Sensors, Molecules, Modulation, Eye, Signal detection, Superposition
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173561
TOPICS: CCD image sensors, Interferometers, Modulation, Scanning probe microscopy, Semiconductor lasers, Image sensors, Spatial resolution, Phase interferometry, Photodetectors, Signal detection
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176507
TOPICS: Moire patterns, Modulation, Data acquisition, Semiconductor lasers, Cameras, Head, Defect detection, Phase shifting, Imaging systems, Structured light
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.177107
TOPICS: Receivers, Signal to noise ratio, Photodiodes, Electronic filtering, Optical filters, Optical amplifiers, Laser scanners, 3D scanning, LIDAR, Mirrors
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173564
TOPICS: Spectrographs, Monochromatic aberrations, Diffraction gratings, Holography, Objectives, Aberration correction, Optical design, Fiber optic illuminators, Spherical lenses, Wavefronts
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173572
TOPICS: Scattering, Light scattering, Mie scattering, Biomedical optics, Signal attenuation, Photons, Picosecond phenomena, Laser scattering, Sensors, Radiative transfer
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176518
TOPICS: Standards development, Visibility, Tolerancing, Reflection, Surface finishing, Microscopes, Polishing, Mirrors, Surface roughness, Scattering
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.173548
TOPICS: Sensors, Tomography, Crystals, Silicon, Diffraction, Scattering, Laser crystals, X-rays, Laser scattering, Signal detection
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176524
TOPICS: Holography, Interferometers, Holographic interferometry, Holograms, Moire patterns, Modulation, Stress analysis, Optical engineering, Collimation, Illumination engineering
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/12.176520
TOPICS: Fourier transforms, Spatial frequencies, Photons, Holography, Chlorine, Image processing, Error analysis, Interferometry, System on a chip, Americium
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/1.OE.33.8.bkrvw1
Opt. Eng. 33(8), (1 August 1994)https://doi.org/10.1117/1.OE.33.8.bkrvw2
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