Optical Engineering
VOL. 33 · NO. 11 | November 1994

Articles (48)
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.192345
TOPICS: Optical engineering, X-ray optics, Optics, Physics, Image processing, Roads, Optical communications, Applied physics, Gold, Ophthalmology
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.192344
TOPICS: Micro optics, Semiconductor lasers, Photonics, Integrated optics, Lenses, Optical engineering, Aerospace engineering, Telecommunications, Roads, Computing systems
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181572
TOPICS: Microlens, Microelectromechanical systems, Diffraction, Micro optics, Microlens array, Microopto electromechanical systems, Sensors, Actuators, Photoresist materials, Silicon
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179876
TOPICS: Zone plates, Finite element methods, Binary data, Diffraction gratings, Scattering, Polarization, Chemical elements, Phase shifts, Diffraction, Instrument modeling
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179886
TOPICS: Lenses, Binary data, Diffraction, Optical fibers, Silicon, Semiconducting wafers, Computer aided design, Single mode fibers, Receivers, Etching
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179893
TOPICS: Lenses, Diffraction, Silicon, Antireflective coatings, Glasses, Refractive index, Diffractive optical elements, Quartz, Photomasks, Reflection
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179880
TOPICS: Etching, Reactive ion etching, Photomasks, Silicon, Microlens, Dry etching, Diffraction, Microlens array, Photoresist materials, Optical lithography
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179887
TOPICS: Microlens, Photoresist materials, Spherical lenses, Lenses, Profilometers, Optical spheres, Interferometry, Helium cadmium lasers, Lithography, Fabrication
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179892
TOPICS: Photoresist materials, Microlens, Optical components, Nickel, Photoresist developing, Laser applications, Microlens array, Computer generated holography, Laser systems engineering, Surface roughness
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179878
TOPICS: Glasses, Temperature metrology, Laser processing, Optics manufacturing, Ceramics, Laser applications, Optical components, Laser optics, Laser glasses, Refractive index
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179877
TOPICS: Glasses, Crystals, Laser crystals, Ceramics, Optical properties, Transmittance, Carbon dioxide lasers, Modulation transfer functions, Visible radiation, Refractive index
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179881
TOPICS: Etching, Mirrors, Micromirrors, Silicon, Semiconducting wafers, Polishing, Oxides, Surface finishing, Spherical lenses, Micromachining
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179882
TOPICS: Diffraction gratings, Head, Data storage, Signal detection, Diffraction, Polarization, Beam splitters, Optical components, Birefringence, Refractive index
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179884
TOPICS: Electronic filtering, Phase only filters, Sensors, Pattern recognition, Computer programming, Optical filters, Optical pattern recognition, Phase measurement, Signal detection, Diffraction
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179888
TOPICS: Binary data, Optical design, Scattering, Near field, Diffraction gratings, Diffraction, Multiple scattering, Polarization, Near field optics, Chemical elements
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179890
TOPICS: Diffraction gratings, Optical components, Diffraction, Image processing, Optical design, Prisms, Paraxial approximations, Binary data, Zone plates, Micro optics
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181574
TOPICS: Microlens array, Microlens, Diffraction, Scanners, Actuators, Beam steering, Telecommunications, Transducers, Laser scanners, Geometrical optics
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181580
TOPICS: Image segmentation, Microlens array, Microlens, Relays, Image resolution, Photography, Image analysis, 3D image processing, Image transmission, Spatial resolution
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181576
TOPICS: Camera shutters, Optical choppers, Modulation, Resonators, Etching, Silicon, Microfabrication, Semiconducting wafers, Plasma etching, Sensors
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181578
TOPICS: Mirrors, Modulation, Spatial light modulators, Phase shift keying, Active optics, Microscopes, Interferometry, Phase modulation, Scanning electron microscopy, Metals
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.179889
TOPICS: Sensors, Visualization, Optical sensors, Eye, Optical arrays, Microlens array, Photodetectors, Microlens, Photodiodes, Gradient-index optics
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181173
TOPICS: Light sources, Semiconductor lasers, Modulation, Diodes, Lenses, Laser development, Nonimpact printing, Printing, Collimators, Optical components
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.183489
TOPICS: Diodes, Optical fibers, Semiconductor lasers, Laser systems engineering, Laser processing, High power lasers, Microlens array, Micro optics, Collimation, Information operations
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181146
TOPICS: Sensors, Space operations, Atmospheric sensing, Satellites, Temperature metrology, Earth's atmosphere, Bandpass filters, Infrared sensors, Clouds, Infrared radiation
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181932
TOPICS: Diffusers, Reflectivity, Aluminum, Contamination, Ultraviolet radiation, Calibration, Ozone, Space operations, Visible radiation, Environmental sensing
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181150
TOPICS: Capacitance, LCDs, Electrodes, Resistance, Liquid crystals, Thin films, Transistors, Plasma, Silicon, Photoresist materials
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181144
TOPICS: Projection systems, Autostereoscopic displays, Stereoscopic displays, LCDs, Eye, Mirrors, Glasses, Photography, Motion controllers, 3D displays
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.183386
TOPICS: Plasmas, Diagnostics, Four wave mixing, Phase conjugation, Laser scattering, Scattering, Magnetism, Nonlinear optics, Americium, Reflectivity
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181183
TOPICS: Fringe analysis, Fourier transforms, Algorithm development, Binary data, Modulation, Tolerancing, Physics, Electro optics, Image segmentation, Detection and tracking algorithms
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181923
TOPICS: Fringe analysis, 3D image processing, Fourier transforms, Phase shifts, Phase shifting, Interferometry, Image analysis, Image processing, Interferometers, Error analysis
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181925
TOPICS: Holography, Monochromatic aberrations, Collimation, Tolerancing, Particles, Wavefronts, Holograms, Diffraction, Ruby, Optical spheres
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181938
TOPICS: Magnetism, Magnetic sensors, Sensors, Polarization, Magneto-optics, Kerr effect, Reflection, Polarizers, Light sources, Sensing systems
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181178
TOPICS: Moire patterns, Telescopes, Retroreflectors, Deflectometry, Cameras, Optical instrument design, Glasses, Phase measurement, Collimation, Distortion
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.183390
TOPICS: Convolution, Optoelectronics, Detection and tracking algorithms, Target recognition, Mathematical morphology, Image processing, Missiles, Binary data, Fourier transforms, Charge-coupled devices
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.183388
TOPICS: Image processing, Binary data, Adaptive optics, Computing systems, Raster graphics, Image storage, Visualization, Detection and tracking algorithms, Imaging arrays, Computer engineering
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181152
TOPICS: Neurons, Neural networks, Edge detection, Sensors, Image processing, Detection and tracking algorithms, Evolutionary algorithms, Analog electronics, Image segmentation, Optimization (mathematics)
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181939
TOPICS: Turbulence, Scattering, Scintillation, Atmospheric optics, Atmospheric modeling, Telecommunications, Error analysis, Optical communications, Atmospheric propagation, Mathematical modeling
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181162
TOPICS: Receivers, Telecommunications, Optical filters, Signal to noise ratio, Absorption, Magnetism, Transmitters, Free space optical communications, Laser communications, Rubidium
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181167
TOPICS: Mass attenuation coefficient, Laser range finders, Atmospheric modeling, Signal to noise ratio, Aerosols, Fiber optic gyroscopes, Humidity, Visibility, Visibility through fog, Atmospheric particles
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181176
TOPICS: Analog electronics, Microscopes, Scanners, Confocal microscopy, Mirrors, Clocks, Laser scanners, 3D scanning, Position sensors, Signal generators
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181186
TOPICS: Sensors, Calibration, Signal to noise ratio, Spectroscopy, Lamps, Infrared spectroscopy, Reflectivity, Short wave infrared radiation, Spectral resolution, Electronics
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181936
TOPICS: Image restoration, Navigation systems, Cameras, Visualization, Sensors, Image sensors, Digital imaging, Computer simulations, 3D modeling, Image processing
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181147
TOPICS: Target detection, Target acquisition, Performance modeling, Visual process modeling, Image processing, Visualization, Systems modeling, Eye models, Eye, Visual system
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181180
TOPICS: Turbulence, Wavefronts, Phase measurement, Fluctuations and noise, Imaging systems, Temperature metrology, Atmospheric propagation, Wavefront sensors, Shearing interferometers, Atmospheric turbulence
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181175
TOPICS: Imaging systems, Target detection, Scattering, Light scattering, Objectives, Cameras, Stray light, Modulation transfer functions, Sensors, Optical testing
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.181138
TOPICS: Reflectivity, Attenuators, Mirrors, Fabry–Perot interferometers, Reflection, Antireflective coatings, Dielectric mirrors, Reflectors, Optical engineering, Dielectrics
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/12.184358
TOPICS: Reflectivity, Monochromatic aberrations, Reflection, Modulation, Mirrors, Telecommunications, Attenuators, Gaussian beams, Thin films, Aerospace engineering
Opt. Eng. 33(11), (1 November 1994)https://doi.org/10.1117/1.OE.33.11.bkrvw1
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