1 February 1995 Simple technique for out-of-focus feature alignment
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Abstract
A simple technique for in-line alignment of features that are axially separated is discussed. The precision of the technique is 2.5 μm or better.
Jose M. Sasian and Douglas A. Baillie "Simple technique for out-of-focus feature alignment," Optical Engineering 34(2), (1 February 1995). https://doi.org/10.1117/12.194047
Published: 1 February 1995
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Microscopes

Optical alignment

Feature extraction

Geometrical optics

Interfaces

Microlens array

Switching

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