Optical Engineering
VOL. 34 · NO. 2 | February 1995

Articles (44)
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.210191
TOPICS: Optical engineering, X-ray optics, Physics, Optics, Image processing, Roads, Lead, Ophthalmology, Silicon, Polarization analysis
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.210192
TOPICS: Heat flux, X-rays, Optical engineering, Synchrotrons, Mirrors, X-ray optics, Optical components, Thermography, Monochromators, Optical design
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194032
TOPICS: Mirrors, Distortion, Silicon carbide, Synchrotrons, Laser applications, Silicon, Copper, Molybdenum, Laser optics, Laser development
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194031
TOPICS: Mirrors, Motion measurement, Information operations, Mirror mounts, Received signal strength, Acoustics, Correlation function, Turbulence, Motion analysis, Electromagnetism
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194195
TOPICS: Mirrors, Distortion, Interferometers, Temperature metrology, Optical coatings, Electron beams, Cameras, High power lasers, Glasses, Raster graphics
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194100
TOPICS: Heat flux, Liquids, Metals, Optical components, Capillaries, Particles, Copper, Performance modeling, Silicon, Interfaces
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194193
TOPICS: Synchrotron radiation, Polarization, Magnetism, Optical components, X-rays, Photon polarization, Optical design, Electron beams, Charged particle optics, Solids
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.196057
TOPICS: Mirrors, X-rays, Sensors, Fractal analysis, Spatial frequencies, Diffraction, Image quality, Surface finishing, Scattering, X-ray imaging
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194835
TOPICS: Mirrors, X-rays, Monochromatic aberrations, Silicon, Silicon carbide, Hard x-rays, Reflectivity, Scattering, X-ray optics, Reflection
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194832
TOPICS: Mirrors, Silicon carbide, Chemical vapor deposition, Vacuum ultraviolet, Reflectivity, X-rays, Copper, Multilayers, Profilometers, Coating
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194836
TOPICS: Mirrors, Silicon, X-rays, Metrology, Polishing, Optics manufacturing, Hard x-rays, Synchrotron radiation, X-ray optics, Synchrotrons
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194834
TOPICS: Mirrors, Prisms, Head, Distortion, Interferometers, In situ metrology, Fourier transforms, Profilometers, Laser beam diagnostics, Beam splitters
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.195194
TOPICS: Mirrors, Polishing, Surface finishing, Spherical lenses, Synchrotrons, Tolerancing, Integrated optics, Surface roughness, Optical testing, Grazing incidence
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.195740
TOPICS: Mirrors, Metals, Beam shaping, X-rays, Optical components, Composites, Tolerancing, Error analysis, Statistical analysis, Optical engineering
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194621
TOPICS: Crystals, Silicon, Monochromators, X-rays, Liquids, Laser crystals, Diamond, Liquid crystals, Diffraction, Metals
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.195196
TOPICS: Crystals, Liquids, Cryogenics, Nitrogen, Silicon, Monochromators, Selenium, Laser crystals, Distortion, Crystallography
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.195195
TOPICS: Crystals, Diamond, Laser crystals, Silicon, Monochromators, X-rays, Crystallography, Heat flux, Single crystal X-ray diffraction, Synchrotrons
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.195395
TOPICS: Crystals, Monochromators, Silicon, X-rays, Laser crystals, Resistance, Prototyping, Synchrotron radiation, Synchrotrons, Copper
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194837
TOPICS: X-rays, Reflectivity, Multilayers, Crystals, Mirrors, Silicon, Annealing, Monochromators, Molybdenum, Synchrotrons
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194045
TOPICS: Silicon, Spectroscopic ellipsometry, Polarizers, Semiconducting wafers, Ellipsometry, Dielectrics, Data modeling, Oxides, Spectroscopy, Chemical vapor deposition
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194040
TOPICS: Doppler effect, Blood, In vivo imaging, Blood circulation, Velocity measurements, Calibration, Light scattering, Fiber lasers, Sensors, Fluid dynamics
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188614
TOPICS: Radiometry, Temperature metrology, Optical fibers, Silver, Signal detection, Sensors, Fiber optics, Calibration, Fiber optics tests, Black bodies
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194046
TOPICS: Diffraction gratings, Photoresist developing, Diffraction, Photoresist materials, Manufacturing, Detector development, Diagnostics, Process control, Mirrors, Laser beam diagnostics
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194049
TOPICS: Holography, Diffraction, Polymers, Data storage, Holograms, Diffraction gratings, Surface plasmons, Absorption, Refractive index, Energy efficiency
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188613
TOPICS: Mirrors, Interferometry, Image processing, Sensors, Holography, Vibrometry, Fringe analysis, Modulation, Data processing, Phase shifts
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188618
TOPICS: Beam splitters, Interferometers, Interferometry, Glasses, Semiconductor lasers, Radon, Fringe analysis, Prisms, Refractive index, Modulation
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188598
TOPICS: Aerosols, Wind measurement, LIDAR, Doppler effect, Sensors, Atmospheric modeling, Scattering, Atmospheric particles, Telescopes, Optical filters
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188599
TOPICS: Clouds, Optical communications, Monte Carlo methods, Transmitters, Mathematical modeling, Free space optics, Wave propagation, Receivers, Systems modeling, Channel projecting optics
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188600
TOPICS: Sensors, Clouds, Receivers, Optical communications, Telecommunications, Detector arrays, Transmitters, Avalanche photodetectors, Adaptive optics, Signal to noise ratio
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194048
TOPICS: Holograms, Vertical cavity surface emitting lasers, Sensors, Diffraction, Optical interconnects, Holography, Free space optics, Optical design, Distortion, Computing systems
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188594
TOPICS: Spatial light modulators, Fourier transforms, Diffraction, Reflectivity, Image resolution, Cameras, Image filtering, CCD cameras, Spatial filters, Spatial frequencies
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188604
TOPICS: Semiconducting wafers, Optical spheres, Particles, Mirrors, Diffraction, Silicon, Transform theory, Latex, Sensors, Signal detection
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194047
TOPICS: Optical alignment, Microscopes, Feature extraction, Microlens array, Switching, Interfaces, Geometrical optics, Optical computing, Microlens, Optical instrument design
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194034
TOPICS: Mirrors, Telescopes, Tolerancing, Polonium, Wavefronts, Titanium, Monochromatic aberrations, Numerical analysis, Algorithms, Zerodur
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.194038
TOPICS: Tolerancing, Mirrors, Ultraviolet radiation, Imaging systems, Image quality, Space telescopes, Phase modulation, Astronomical imaging, Telescopes, Optical fabrication
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188608
TOPICS: Spectroscopy, Spectral resolution, Diffraction, Semiconductor lasers, Visible radiation, Absorption, Collimators, Prisms, Micro optics, Light sources
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188591
TOPICS: Absorption, Spectrophotometry, Monochromators, Optical filters, Calibration, Luminescence, Singular optics, Absorption filters, Data acquisition, Scattering
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188616
TOPICS: Tantalum, Refractive index, Argon, Ions, Oxides, Sputter deposition, Oxygen, Thin films, Deposition processes, Ion beams
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188603
TOPICS: GRIN lenses, Sensors, Micro unmanned aerial vehicles, Lenses, Signal detection, Optical tracking, Target detection, Optical fabrication, Prototyping, Signal processing
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188590
TOPICS: Waveguides, Temperature metrology, Metals, Black bodies, Carbon dioxide lasers, Infrared radiation, Thermal effects, Radiation effects, Endoscopes, Laser energy
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188609
TOPICS: Monochromatic aberrations, Imaging systems, Optical imaging, Image acquisition, Image quality, Error analysis, Modulation transfer functions, Spatial frequencies, Information theory, Refractor telescopes
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/12.188611
TOPICS: Channel projecting optics, Neural networks, Spatial light modulators, System on a chip, Singular optics, Transmittance, Statistical optics, Liquid crystals, Charge-coupled devices, Optical imaging
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/1.OE.34.2.bkrvw1
Opt. Eng. 34(2), (1 February 1995)https://doi.org/10.1117/1.OE.34.2.bkrvw2
Back to Top