Linear integer unconcerned phase-map profilometry by changing the projection angle of the grating

Jingang Zhong

doi:10.1117/1.1385334

1 July 2001 Linear integer unconcerned phase-map profilometry by changing the projection angle of the grating

Jingang Zhong

Optical Engineering, Vol. 40, Issue 7, (July 2001). https://doi.org/10.1117/1.1385334

Linear integer unconcerned phase-map fringe projection pro- filometry has been used to measure the 3-D shape of objects with discontinuous height steps. The projection is carried out with the conventional crossed-optical-axes geometry. Linear integer unconcerned phase maps are obtained by changing the projecting angle of the grating. A lookup-table algorithm is applied to phase unwrapping. An automated analysis of the fringe patterns is carried out by the Fourier transform method. Experimental results are presented that demonstrate the validity of the principle.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Jingang Zhong "Linear integer unconcerned phase-map profilometry by changing the projection angle of the grating," Optical Engineering 40(7), (1 July 2001). https://doi.org/10.1117/1.1385334

Published: 1 July 2001

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