Translator Disclaimer
1 January 2002 New wavelet transforms for noise insensitive edge detection
Author Affiliations +
Two new wavelet transforms for noise-insensitive edge detection are analyzed and discussed. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.
©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Feijun Song and Suganda Jutamulia "New wavelet transforms for noise insensitive edge detection," Optical Engineering 41(1), (1 January 2002). https://doi.org/10.1117/1.1424877
Published: 1 January 2002
JOURNAL ARTICLE
5 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top