1 April 2003 Determination of the optical constants of an arbitrarily oriented anisotropic thin film by exciting surface plasmons analyzed by the nonsymmetric theory
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The sensitivities of surface plasmon resonance spectroscopy are higher than reflection/transmission measurement in determining the anisotropic properties of an arbitrarily oriented anisotropic thin film. The corrected Airy formula for calculating the reflection coefficient is used to calculate the reflection of the Kretschmann configuration by considering the nonsymmetric reflection phenomenon in anisotropic film. The optical constants and the thickness of the anisotropic film are obtained from the attenuated-total-reflection (ATR) curve.
©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)
Yi-Jun Jen and Cheng-chung Lee "Determination of the optical constants of an arbitrarily oriented anisotropic thin film by exciting surface plasmons analyzed by the nonsymmetric theory," Optical Engineering 42(4), (1 April 2003). https://doi.org/10.1117/1.1557172
Published: 1 April 2003
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Cited by 4 scholarly publications.
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KEYWORDS
Reflection

Silver

Thin films

Surface plasmons

Refractive index

Refraction

Optical testing

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