Planar pattern for automatic camera calibration

B. Zhang; Youfu Li; Fuchao Wu

doi:10.1117/1.1574037

1 June 2003 Planar pattern for automatic camera calibration

B. Zhang, Youfu Li, Fuchao Wu

Optical Engineering, Vol. 42, Issue 6, (June 2003). https://doi.org/10.1117/1.1574037

We present a method for automatic camera calibration that requires only that a planar pattern be visible by the camera from a few (at least three) different views. A major issue is how to obtain the projection of an absolute point using the planar pattern. In the calibration, we can move either the camera or the planar pattern and no knowledge about the motion is required. We consider and resolve both linear and nonlinear parameters. In testing the proposed methods, satisfactory results are achieved in the simulation and in real data experiments.

©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)

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B. Zhang, Youfu Li, and Fuchao Wu "Planar pattern for automatic camera calibration," Optical Engineering 42(6), (1 June 2003). https://doi.org/10.1117/1.1574037

Published: 1 June 2003

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