Geometrical superresolution in infrared sensor: experimental verification

Zeev Zalevsky; Noam Shamir; David Mendlovic

doi:10.1117/1.1737372

1 June 2004 Geometrical superresolution in infrared sensor: experimental verification

Zeev Zalevsky, Noam Shamir, David Mendlovic

Author Affiliations +

Optical Engineering, Vol. 43, Issue 6, (June 2004). https://doi.org/10.1117/1.1737372

Abstract

The resolution of many imaging systems is often restricted by the limited spatial resolution of its sensing device rather than by diffraction limits related to the optical system. This spatial resolution of the sensor, when limited by the pixels' dimensions, is coined as "geometrical resolution." Earlier, we suggested a technique for overcoming this limit, thus obtaining "geometrical superresolution." The proposed approach is based on capturing a set of images after attaching special predesigned mask to the detector plane, interlacing the pixels of the captured images, and eventually applying inverse filtering over the interlaced image. Experimental results are presented to demonstrate the ability of the suggested technique.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Zeev Zalevsky, Noam Shamir, and David Mendlovic "Geometrical superresolution in infrared sensor: experimental verification," Optical Engineering 43(6), (1 June 2004). https://doi.org/10.1117/1.1737372

Published: 1 June 2004

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