Light-diffusion mark constituted with two-dimensional speckle patterns for enhancing hologram anticounterfeiting characteristics

S. L. Yeh

doi:10.1117/1.1641786

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1 March 2004 Light-diffusion mark constituted with two-dimensional speckle patterns for enhancing hologram anticounterfeiting characteristics

S. L. Yeh

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Optical Engineering, 43(3), (2004). https://doi.org/10.1117/1.1641786

We propose a new speckle method for enhancing the anticounterfeiting ability of holograms. The method adds light-diffusion marks on holograms. These marks are constituted with periodic speckle patterns. The size of element patterns is very small, so a microscope must be used to check the 2-D microstructure of a mark. When a laser beam illuminates a light-diffusion mark, the diffused light produces a special matrix intensity distribution. Because it is difficult to create an identical random speckle arrangement using different process setups, the matrix intensity distribution diffracted from a specially created light-diffusion mark is nearly impossible to counterfeit. Although holographic films possess birefringent phenomena, the diffraction efficiencies of marks that fit some confinement conditions can be kept stable for light with different polarizations. The proposed method is a good choice for enhancing hologram anticounterfeiting characteristics.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

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S. L. Yeh "Light-diffusion mark constituted with two-dimensional speckle patterns for enhancing hologram anticounterfeiting characteristics," Optical Engineering 43(3), (1 March 2004). https://doi.org/10.1117/1.1641786

Published: 1 March 2004

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