Flaw detection using lock-in temporal speckle pattern interferometry and thermal waves

Andrés E. Dolinko; Guillermo H. Kaufmann

doi:10.1117/1.2801725

1 November 2007 Flaw detection using lock-in temporal speckle pattern interferometry and thermal waves

Andrés E. Dolinko, Guillermo H. Kaufmann

Author Affiliations +

Optical Engineering, Vol. 46, Issue 11, 115601 (November 2007). https://doi.org/10.1117/1.2801725

Abstract

This paper presents the evaluation of a removal method to cancel the thermal convection effect that is generated in vertically positioned metal plates loaded by thermal waves when a lock-in temporal speckle pattern interferometry technique is used to detect hidden flaws. Additionally, the resolution of this technique to detect two nearby flaws is also analyzed.

©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Andrés E. Dolinko and Guillermo H. Kaufmann "Flaw detection using lock-in temporal speckle pattern interferometry and thermal waves," Optical Engineering 46(11), 115601 (1 November 2007). https://doi.org/10.1117/1.2801725

Published: 1 November 2007

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available