1 December 2007 All-in-one measurement setup for fast and accurate linear characterization of guided-wave optical devices
Davide Castaldini, Paolo Bassi, Sorin Tascu, Greg Sauder, Pierre Aschieri, Marc P. De Micheli, Pascal A. Baldi, Krishna Thyagarajan, Mangalpady R. Shenoy
Author Affiliations +
Abstract
We present an all-in-one, computer-controlled, measurement setup able to evaluate propagation losses, effective group index, and mode size of integrated optical devices and optical fibers. The possibility to use a single setup, instead of three separate ones, enables faster measurements, improvements in terms of reproducibility and precision, and reduction of systematic errors. Control of the operating conditions, easier system upgrade besides cost and laboratory space savings are other additional features of this system. To confirm proper operation and versatility of the proposed setup, different samples are successfully characterized, and results are presented and discussed.
©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Davide Castaldini, Paolo Bassi, Sorin Tascu, Greg Sauder, Pierre Aschieri, Marc P. De Micheli, Pascal A. Baldi, Krishna Thyagarajan, and Mangalpady R. Shenoy "All-in-one measurement setup for fast and accurate linear characterization of guided-wave optical devices," Optical Engineering 46(12), 124601 (1 December 2007). https://doi.org/10.1117/1.2821860
Published: 1 December 2007
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical fibers

Waveguides

Polarization

Wave propagation

Integrated optics

Dispersion

Optical engineering

RELATED CONTENT

Guided Wave Optical Power Regulator
Proceedings of SPIE (March 10 1987)
Wdveguide Attenuation Measurements Using A Prism Coupler
Proceedings of SPIE (March 10 1988)

Back to Top