Vertical input transverse resonant cavity device structure for surface refractive index variation sensor

Hideaki Okayama; Yusaku Naoi; Hirochika Nakajima

doi:10.1117/1.3067876

1 January 2009 Vertical input transverse resonant cavity device structure for surface refractive index variation sensor

Hideaki Okayama, Yusaku Naoi, Hirochika Nakajima

Author Affiliations +

Optical Engineering, Vol. 48, Issue 1, 014602 (January 2009). https://doi.org/10.1117/1.3067876

Abstract

A resonant cavity waveguide device structure is reported which uses a grating structure to couple the vertical incident light into the waveguide. A thin, high-refractive-index waveguide is used to attain high sensor sensitivity for the surface refractive index variation measurement.

©(2009) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Hideaki Okayama, Yusaku Naoi, and Hirochika Nakajima "Vertical input transverse resonant cavity device structure for surface refractive index variation sensor," Optical Engineering 48(1), 014602 (1 January 2009). https://doi.org/10.1117/1.3067876

Published: 1 January 2009

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