Representation of homogeneous translucent materials using the P3 approximation and an image-based bidirectional subsurface scattering reflectance distribution function measurement system

Seung-Joo Lee; Hoi Min Kim; Myoung Kook Seo; Kwang Hee Ko; Kwan H. Lee

doi:10.1117/1.3447925

1 June 2010 Representation of homogeneous translucent materials using the P3 approximation and an image-based bidirectional subsurface scattering reflectance distribution function measurement system

Seung-Joo Lee, Hoi Min Kim, Myoung Kook Seo, Kwang Hee Ko, Kwan H. Lee

Author Affiliations +

Optical Engineering, Vol. 49, Issue 6, 063601 (June 2010). https://doi.org/10.1117/1.3447925

Abstract

In computer graphics applications, the standard diffusion model (SDA) is used to represent translucent materials. However, the SDA is not suitable for the representation of the translucent materials with weakly scattering properties. We represent the translucent materials with the weakly scattering properties by using the P3 approximation, since the P3 approximation can more accurately represent such translucent materials than the SDA. We also present an efficient and stable image-based bidirectional subsurface scattering reflectance distribution function measurement system that can measure the reflectance property of homogeneous translucent materials. From the high-dynamic-range image of a translucent material acquired from the proposed image-based measurement systems, the reduced scattering and the absorption coefficients of the material are estimated to represent its translucent property in computer graphics applications. We demonstrate the strength of the P3 approximation for representing the translucent materials using various examples with realistic illumination based on an environmental map.

©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Seung-Joo Lee, Hoi Min Kim, Myoung Kook Seo, Kwang Hee Ko, and Kwan H. Lee "Representation of homogeneous translucent materials using the P3 approximation and an image-based bidirectional subsurface scattering reflectance distribution function measurement system," Optical Engineering 49(6), 063601 (1 June 2010). https://doi.org/10.1117/1.3447925

Published: 1 June 2010

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