You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
4 December 2013Diffractive optics calibrator: design and construction
We present a new device, the diffractive optics calibrator, for measuring duty cycle and etching depth for computer-generated holograms (CGHs). The system scans the CGH with a collimated laser beam and collects the far-field diffraction pattern with a CCD array. The relative intensities of the various orders of diffraction are used to fit the phase shift from etching and the duty cycle of the binary pattern. The system is capable of measuring variations that cause 1-nm peak-to-valley (PV) phase errors in the wavefront created by the CGH. The measurements will be used primarily for quality control CGHs, but the data can also be used to provide a lookup table for corrections that allow calibration of the lithography errors. Such calibrations may be necessary for us to achieve our goal of measuring freeform aspheric surfaces with 1-nm RMS accuracy.