24 July 2014 Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts
Marcus Paulo Raele, Luiz Vicente Gomes Tarelho, Carlos Leonardo da Silva Azeredo, Iakyra B. Couceiro, Anderson Z. de Freitas
Author Affiliations +
Abstract
Low-coherence interferometric setups in the Fourier domain can experience false structures after the Fourier transform procedure due to signal saturation; in fact, these structures are located at multiple frequencies of the original signal, also referred to as harmonics. This study aids in a better understanding of this phenomenon. The aim of the present work was to show that these features can be used to improve differential axial resolution in highly reflective samples. Using an optical coherence tomography system and calibrated step height standards, it was possible to achieve a resolution greater than the light source coherence length.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2014/$25.00 © 2014 SPIE
Marcus Paulo Raele, Luiz Vicente Gomes Tarelho, Carlos Leonardo da Silva Azeredo, Iakyra B. Couceiro, and Anderson Z. de Freitas "Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts," Optical Engineering 53(7), 073106 (24 July 2014). https://doi.org/10.1117/1.OE.53.7.073106
Published: 24 July 2014
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Interferometry

Optical coherence tomography

Spectral resolution

Fourier transforms

Light sources

Optical engineering

Calibration

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