1 April 2014 Toward superfast three-dimensional optical metrology with digital micromirror device platforms
Author Affiliations +
Abstract
Decade-long research efforts toward superfast three-dimensional (3-D) shape measurement leveraging the digital micromirror device (DMD) platforms are summarized. Specifically, we will present the following technologies: (1) high-resolution real-time 3-D shape measurement technology that achieves 30 Hz simultaneous 3-D shape acquisition, reconstruction, and display with more than 300,000 points per frame; (2) superfast 3-D optical metrology technology that achieves 3-D measurement at a rate of tens of kilohertz utilizing the binary defocusing method we invented; and (3) the improvement of the binary defocusing technology for superfast and high-accuracy 3-D optical metrology using the DMD platforms. Both principles and experimental results are presented.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2014/$25.00 © 2014 SPIE
Tyler Bell and Song Zhang "Toward superfast three-dimensional optical metrology with digital micromirror device platforms," Optical Engineering 53(11), 112206 (1 April 2014). https://doi.org/10.1117/1.OE.53.11.112206
Published: 1 April 2014
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CITATIONS
Cited by 20 scholarly publications and 2 patents.
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KEYWORDS
3D metrology

Projection systems

Binary data

3D acquisition

Digital Light Processing

Digital micromirror devices

3D displays

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