Monitoring of growth dynamics of plants under the influence of cadmium using a highly sensitive interferometry technique

Kokge Thilini Kanchana Muthumali De Silva; Uma Maheswari Rajagopalan; Hirofumi Kadono

doi:10.1117/1.OE.55.12.121718

25 July 2016 Monitoring of growth dynamics of plants under the influence of cadmium using a highly sensitive interferometry technique

Kokge Thilini Kanchana Muthumali De Silva, Uma Maheswari Rajagopalan, Hirofumi Kadono

Author Affiliations +

Optical Engineering, Vol. 55, Issue 12, 121718 (July 2016). https://doi.org/10.1117/1.OE.55.12.121718

Abstract

Using statistical interferometry technique (SIT), a highly sensitive interferometry technique developed in our laboratory, we reported about the existence of nanometric intrinsic fluctuations (NIF) in a variety of plants. SIT permits noncontact, noninvasive, and fast detection of plant growth fluctuations in subnanometer scale. We propose the application of NIF to investigate the effect of heavy metal, cadmium, on growth dynamics of Chinese chive (Allium tuberosum). NIFs of leaves were observed for 3 days under four different concentrations of CdCl₂: 0, 0.001, 0.01, and 0.1 mM. Results showed significant reduction of NIFs within 4 h for all Cd concentrations, and there was a further decrease with the exposure time of Cd under 0.1 and 0.01 mM. In addition, under 0.001 mM, a significant recovery could be observed after a rapid reduction in the first 4 h. As a comparison, measured antioxidative enzymes increased with increasing Cd concentration. However, no significant increase could be seen within the initial 4 h under a smaller concentration of 0.001 mM as seen for NIFs. The results imply that NIF can be used as an indicator for heavy metal stress on plants as well as it can be more sensitive to detect the influence of smaller Cd amounts on plants at an early stage.

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Kokge Thilini Kanchana Muthumali De Silva, Uma Maheswari Rajagopalan, and Hirofumi Kadono "Monitoring of growth dynamics of plants under the influence of cadmium using a highly sensitive interferometry technique," Optical Engineering 55(12), 121718 (25 July 2016). https://doi.org/10.1117/1.OE.55.12.121718

Published: 25 July 2016

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