6 July 2017 High-speed high-accuracy three-dimensional shape measurement using digital binary defocusing method versus sinusoidal method
Author Affiliations +
Abstract
This paper presents our research findings on high-speed high-accuracy three-dimensional shape measurement using digital light processing (DLP) technologies. In particular, we compare two different sinusoidal fringe generation techniques using the DLP projection devices: direct projection of computer-generated 8-bit sinusoidal patterns (a.k.a., the sinusoidal method), and the creation of sinusoidal patterns by defocusing binary patterns (a.k.a., the binary defocusing method). This paper mainly examines their performance on high-accuracy measurement applications under precisely controlled settings. Two different projection systems were tested in this study: a commercially available inexpensive projector and the DLP development kit. Experimental results demonstrated that the binary defocusing method always outperforms the sinusoidal method if a sufficient number of phase-shifted fringe patterns can be used.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2017/$25.00 © 2017 SPIE
Jae-Sang Hyun, Beiwen Li, and Song Zhang "High-speed high-accuracy three-dimensional shape measurement using digital binary defocusing method versus sinusoidal method," Optical Engineering 56(7), 074102 (6 July 2017). https://doi.org/10.1117/1.OE.56.7.074102
Received: 3 February 2017; Accepted: 15 June 2017; Published: 6 July 2017
Lens.org Logo
CITATIONS
Cited by 18 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Binary data

Digital Light Processing

Projection systems

Fringe analysis

Optical testing

Projection devices

Back to Top