24 August 2017 Processing depth distance data to increase precision of multiple infrared sensors in the automatic visual inspection system
Piotr Szablata, Pawel Lakowski, Janusz Pochmara
Author Affiliations +
Abstract
Infrared depth recognition technology with an efficient custom-made signal smoothing algorithm is used as a base for a precise inspection system. The main purpose of this paper is to introduce the basics of an algorithm that will improve precision and stabilize distance measurements in projects with camera image and depth sensors. Such results are within the reach of currently available hardware but not with the available software, for which there is a lack of suppliers support. The second goal is to prove that golden sample data matrix compiled from multiple sensors data can be taken into consideration as a simple and general automated optical inspection system.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2017/$25.00 © 2017 SPIE
Piotr Szablata, Pawel Lakowski, and Janusz Pochmara "Processing depth distance data to increase precision of multiple infrared sensors in the automatic visual inspection system," Optical Engineering 56(8), 083106 (24 August 2017). https://doi.org/10.1117/1.OE.56.8.083106
Received: 16 May 2017; Accepted: 1 August 2017; Published: 24 August 2017
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Sensors

Inspection

Optical inspection

Infrared sensors

Cameras

Distance measurement

Error analysis

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