Extracting information of an object which is hidden behind a translucent obstacle is a difficult task. When the obstacle is a diffusing or scattering medium, it becomes much more complicated. The scattering medium makes the phase random, which cannot be retrieved or undone by simple techniques. Many approaches based on interference have been proposed to realise this goal. These approaches have produced good results meanwhile are also very expensive and complex in nature due to the requirement of a separate reference beam to form the interference pattern. We hereby, propose a novel method in which we are illuminating a hidden object with shifted dual beams simultaneously and these two beams are then reflected from the object to produce an interference pattern. This method does not require any separate reference beam to form the interference pattern. The purpose of using dual beam illumination is to eliminate the need of any shearing device to give shear between the object’s fields thus making our technique much more simpler and cost-effective. To validate our technique, a simulation is performed. In this work, we extract the information about the deformation of the object due to loading. In addition, various parameters and their effects on the extraction of information are also mentioned. This technique takes advantage of the merit of Shearography hence the gradient information of the hidden object can also be detected.