Prof. Aaron Lewis
Professor at Hebrew Univ of Jerusalem
SPIE Involvement:
Author | Instructor
Publications (18)

Proceedings Article | 19 March 2015 Paper
P. Hung, Thomas O'Loughlin, Aaron Lewis, Rimma Dechter, Martin Samayoa, Sarbajit Banerjee, Erin Wood, Angela R. Hight Walker
Proceedings Volume 9424, 94241S (2015) https://doi.org/10.1117/12.2175623
KEYWORDS: Raman spectroscopy, Gold, Silicon, Scanning electron microscopy, Metrology, Transmission electron microscopy, Etching, Atomic force microscopy, Particles, Spatial resolution

SPIE Journal Paper | 1 July 2007 Open Access
Thomas Teisseyre, Andrew Millard, Ping Yan, Joseph Wuskell, Mei-de Wei, Aaron Lewis, Leslie Loew
JBO, Vol. 12, Issue 04, 044001, (July 2007) https://doi.org/10.1117/12.10.1117/1.2772276
KEYWORDS: Second-harmonic generation, Chromophores, Signal detection, Luminescence, Head, Fiber lasers, Switches, Harmonic generation, Tissue optics, Femtosecond phenomena

Proceedings Article | 20 April 2001 Paper
Proceedings Volume 4289, (2001) https://doi.org/10.1117/12.424817
KEYWORDS: Near field optics, Waveguides, Near field, Near field scanning optical microscopy, Photonics, Electro optics, Wavelength division multiplexing, Telecommunications, Switches, Optics manufacturing

Proceedings Article | 2 May 2000 Paper
Noel Axelrod, Anna Radko, Nissim Ben-Yosef, Artium Khatchatouriants, Millet Treinin, Aaron Lewis
Proceedings Volume 3919, (2000) https://doi.org/10.1117/12.384191
KEYWORDS: Near field optics, Charge-coupled devices, 3D image processing, Image restoration, Near field, Super resolution, 3D image restoration, Microscopy, Atomic force microscopy, Deconvolution

Proceedings Article | 14 June 1999 Paper
Daniel Palanker, Igor Turovets, Rima Glazer, Benjamin Reubinoff, Dalia Hilman, Aaron Lewis
Proceedings Volume 3601, (1999) https://doi.org/10.1117/12.350026
KEYWORDS: In vitro testing, Laser applications, Coating, Scanning electron microscopy, Optical fibers, Laser drilling, Metals, Microscopes, Glasses, Thin films

Showing 5 of 18 publications
Proceedings Volume Editor (3)

SPIE Conference Volume | 5 December 2001

SPIE Conference Volume | 1 February 1995

SPIE Conference Volume | 1 February 1994

Conference Committee Involvement (15)
Plasmonics: Metallic Nanostructures and Their Optical Properties IX
21 August 2011 | San Diego, California, United States
Plasmonics: Metallic Nanostructures and Their Optical Properties VIII
1 August 2010 | San Diego, California, United States
Plasmonics: Nanoimaging, Nanofabrication, and their Applications V
2 August 2009 | San Diego, California, United States
Plasmonics: Metallic Nanostructures and their Optical Properties VII
2 August 2009 | San Diego, California, United States
Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV
10 August 2008 | San Diego, California, United States
Showing 5 of 15 Conference Committees
Course Instructor
SC021: The Powerful Potential of Near-field Optics in DWDM Tests and Measurements
The telecommunication component industry is facing serious challenges in the area of tests and measurements of passive and active optical components. This challenge is going to become even more demanding as the era of automated integration of optical components is being entered and the final evolution of an all-optical chip is approached. From the current demands of the optical components industry to the future critical needs of this industry near-field optics based tests and measurements is a new approach with 0.05 micron optical that can resolve present pressing demands of this industry while readily answering the requirement for integrated tests and measurements that the future integrated manufacture of telecom component, subsystem and systems will demand.
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