Dr. Adriana Silva Mejia
SPIE Involvement:
Author
Area of Expertise:
Thre-dimensional shape profiling , Phase-shifting , Defocused projection , Binary patterns
Profile Summary

Right now, I am enrolled as a student in the Sciences of Electronics and Computation Ph.D. program at the University of Guadalajara. Since 2012, I have been working whit the Metrology and Instrumentation group of the same university, under the tutorial of the Ph.D. Jorge L. Flores. As a young researcher, my interest includes optical metrology, fringe projection, phase retrieval, optimization, programming, image processing and its applications.
As student chapter member, I participate in the organization and development of diverse scientific and technological events, as conferences, fairs, workshops, etc.
Publications (3)

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11128, 1112813 (2019) https://doi.org/10.1117/12.2530466
KEYWORDS: Binary data, Fringe analysis, 3D metrology, Projection systems, Modulation, Cameras, Phase shift keying, Digital Light Processing, Phase shifts, Nonlinear response

Proceedings Article | 30 August 2017 Paper
Proceedings Volume 10403, 1040312 (2017) https://doi.org/10.1117/12.2275355
KEYWORDS: 3D metrology, Binary data, Profiling, Fringe analysis, Phase shifts, Projection systems

Proceedings Article | 12 September 2014 Paper
Proceedings Volume 9219, 92190L (2014) https://doi.org/10.1117/12.2062479
KEYWORDS: Binary data, 3D metrology, Projection systems, Modulation, Gaussian filters, Digital filtering, Picosecond phenomena, Phase shifts, Phase shift keying, Linear filtering

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