Dr. Alan G. Jacobs
at US Naval Research Lab
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 12 April 2021 Presentation
Marko Tadjer, Fikadu Alema, Andrei Osinsky, Michael Mastro, Neeraj Nepal, Jeffrey Woodward, Rachael Myers-Ward, Evan Glaser, Jaime Freitas, Alan Jacobs, James Gallagher, Alyssa Mock, Daniel Pennachio, Jenifer Hajzus, Mona Ebrish, Travis Anderson, Karl Hobart, Jennifer Hite, Charles Eddy
Proceedings Volume 11742, 117420W (2021) https://doi.org/10.1117/12.2588499
KEYWORDS: Metalorganic chemical vapor deposition, Field effect transistors, Transistors, Silicon carbide, Scattering, Temperature metrology, Silicon, Semiconductors, Roads, Resistance

Proceedings Article | 5 March 2021 Presentation
Marko Tadjer, Fikadu Alema, Andrei Osinsky, Michael Mastro, Neeraj Nepal, Jeffrey Woodward, Rachael Myers-Ward, Evan Glaser, Jaime Freitas, Alan Jacobs, James Gallagher, Alyssa Mock, Daniel Pennachio, Jenifer Hajzus, Mona Ebrish, Travis Anderson, Karl Hobart, Jennifer Hite, Charles Eddy
Proceedings Volume 11687, 116870S (2021) https://doi.org/10.1117/12.2588944
KEYWORDS: Metalorganic chemical vapor deposition, Field effect transistors, Electronics, Transistors, Silicon carbide, Scattering, Atmospheric plasma, Silicon, Semiconductors, Roads

Proceedings Article | 1 March 2019 Paper
Proceedings Volume 10918, 1091816 (2019) https://doi.org/10.1117/12.2510582
KEYWORDS: Gallium nitride, Annealing, Doping, Diodes, Ion implantation, Metalorganic chemical vapor deposition, Semiconducting wafers, Luminescence, Raman spectroscopy

SPIE Journal Paper | 7 July 2015 Open Access
JM3, Vol. 14, Issue 03, 031205, (July 2015) https://doi.org/10.1117/12.10.1117/1.JMM.14.3.031205
KEYWORDS: Annealing, Polymers, Scanning electron microscopy, Gas lasers, Polymer thin films, Temperature metrology, Plasma etching, Diffusion, Semiconductor lasers, Directed self assembly

Proceedings Article | 19 March 2015 Paper
Alan Jacobs, Clemens Liedel, Christopher Ober, Michael Thompson
Proceedings Volume 9423, 942309 (2015) https://doi.org/10.1117/12.2086057
KEYWORDS: Scattering, Annealing, Polymers, Temperature metrology, X-rays, Laser scattering, Grazing incidence, Silicon, Polymer thin films, Directed self assembly

Showing 5 of 6 publications
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