Mr. Albert G. Beyerle Profile

Albert G. Beyerle

Manager at Mirmar Sensor LLC

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 17 September 2005 Paper

Albert Beyerle

Proceedings Volume 5922, 59220C (2005) https://doi.org/10.1117/12.622628

KEYWORDS: Sensors, Xenon, Gamma radiation, Spectrometers, Cesium, Spectroscopy, X-rays, Amplifiers, Barium, Standards development

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