Dr. Alena Andryzhyieuskaya
System Engineer at ASML Netherlands BV
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 September 2011 Paper
Alena Andryzhyieuskaya, Michiel Kupers, John van Keulen, Tom van der Hoeff, Pablo Gabolde, Jeroen J. H. Linders, Bart Smits, Hiroshi Tanaka, Junichi Fujimoto, Satoshi Tanaka, Takahito Kumazaki
Proceedings Volume 8167, 81671X (2011) https://doi.org/10.1117/12.898556
KEYWORDS: Semiconducting wafers, Laser drilling, Lithography, Fabry–Perot interferometers, Overlay metrology, Optical lithography, Extreme ultraviolet, Laser stabilization, Light sources, Scanners

Proceedings Article | 23 March 2011 Paper
Alena Andryzhyieuskaya, Frank Staals, Thijs Hollink, Marcel Beems, Rob Willekers, Jan Mulkens, Peter Engblom, Angelique Nachtwein, Toralf Gruner, Hans Bakker, Jo Finders, Youping Zhang
Proceedings Volume 7973, 79731G (2011) https://doi.org/10.1117/12.880759
KEYWORDS: Wavefronts, Photomasks, Scanners, Source mask optimization, Optimization (mathematics), Semiconducting wafers, 3D acquisition, Reticles, Computational lithography, 3D image processing

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